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Author

A. Adel

Bio: A. Adel is an academic researcher from Al-Azhar University. The author has contributed to research in topics: Band gap & Thin film. The author has an hindex of 1, co-authored 2 publications receiving 19 citations.

Papers
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Journal ArticleDOI
TL;DR: In this article, the optical properties of polycrystalline ZnSe1−xTex (0.0≤x≤1.0) thin films were compared using variable angle spectroscopic ellipsometry (VASE) and spectrophotometry.

19 citations

DOI
07 Jan 2016
TL;DR: In this article, the optical constants and film thickness of nanocrystalline ZnSe1−xTex films were obtained by fitting the spectroscopic ellipsometric data (ψ, Δ) using a three-layer model system in the wavelength range from 400 to 1100 nm.
Abstract: Polycrystalline thin films of ZnSe1−xTex (0.0 ≤ x ≤ 1.0) were deposited on glass substrate using electron beam deposition technique. The structure of the prepared films was examined using X-ray diffraction technique and revealed that the deposited films have polycrystalline zinc blend structure. The optical constants and film thicknesses of nanocrystalline ZnSe1−xTex films were obtained by fitting the spectroscopic ellipsometric data (ψ, Δ) using a three-layer model system in the wavelength range from 400 to 1100 nm. The refractive index was observed to increase with increasing Te concentration. This increase in the refractive index with increasing Te content may be attributed to the increase in the polarizability due to the large ionic radius of Te compared to the ionic radius of Zn. The optical studies of the polycrystalline ZnSe1−xTex films showed that the refractive index increases and fundamental band gap opt g E decreases from 2.58 to 2.21 eV as the tellurium concentration increases from 0 to 1. Furthermore, it was also found that the variation of optical band gap with composition shows quadratic behavior. Keywords: ZnSe1−xTex thin film, nanocrystalline, Spectroscopic ellipsometry, bandgap.

1 citations


Cited by
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Journal ArticleDOI
TL;DR: The aim of this study was to produce nanocomposite polymer fibres, consisting of a matrix of polyacrylonitrile (PAN) and a reinforcing phase in the form of SiO/TiO2/Bi2O3 nanoparticles, by electrospinning the solution.
Abstract: The aim of this study was to produce nanocomposite polymer fibres, consisting of a matrix of polyacrylonitrile (PAN) and a reinforcing phase in the form of SiO2/TiO2/Bi2O3 nanoparticles, by electrospinning the solution. The effect of the nanoparticles and the electrospinning process parameters on the morphology and physical properties of the obtained composite nanofibres was then examined. The morphology of the fibres and the dispersion of nanoparticles in their volume were examined using scanning electron microscopy (SEM). All of the physical properties, which included the band gap width, dielectric constant and refractive index, were tested and plotted against the concentration by weight of the used reinforcing phase, which was as follows: 0%, 4%, 8% and 12% for each type of nanoparticles. The width of the band gap was determined on the basis of the absorption spectra of radiation (UV-vis) and ellipsometry methods. Spectroscopic ellipsometry has been used in order to determine the dielectric constant, refractive index and the thickness of the obtained fibrous mats.

28 citations

Journal ArticleDOI
TL;DR: In this article, the structural, surface morphology and optical properties of multi-thickness nanocrystalline NiO/glass substrate and IC thin films were investigated using spectroscopic ellipsometry (SE) technique.

26 citations

Journal ArticleDOI
TL;DR: In this paper, the optical properties of ZnS/ITO/glass films with various thicknesses were examined structurally and optically using spectroscopic ellipsometric and spectrophotometric techniques.

19 citations

Journal ArticleDOI
TL;DR: In this article, the structural, optical spectroscopic ellipsometry and morphological properties of nanocrystalline Hg1-xMnxO (0.1, 0.2) oxide diluted magnetic semiconductor thin films synthesized by electron beam deposition technique have been investigated by means of X-ray diffraction (XRD) and atomic force microscopy (AFM) techniques.

19 citations