Author
A. M. Baró
Other affiliations: Autonomous University of Madrid
Bio: A. M. Baró is an academic researcher from Spanish National Research Council. The author has contributed to research in topics: Scanning tunneling microscope & Scanning probe microscopy. The author has an hindex of 41, co-authored 139 publications receiving 12731 citations. Previous affiliations of A. M. Baró include Autonomous University of Madrid.
Papers published on a yearly basis
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TL;DR: The most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows, are described and some relevant procedures of the software are carried out.
Abstract: In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
6,996 citations
TL;DR: First principles electronic structure calculations indicate that lambda-DNA chains should present large resistance values, and it is shown that low energy electron bombardment induces a rapid contamination and dramatically affects the measured conductivity, thus providing an explanation to recent reports of high DNA conductivity.
Abstract: The electrical conductivity of biomaterials on a molecular scale is of fundamental interest in the life sciences. We perform first principles electronic structure calculations, which clearly indicate that lambda-DNA chains should present large resistance values. We also present two direct procedures to measure electrical currents through DNA molecules adsorbed on mica. The lower limit for the resistivity is 10(6) Omega . cm, in agreement with our calculations. We also show that low energy electron bombardment induces a rapid contamination and dramatically affects the measured conductivity, thus providing an explanation to recent reports of high DNA conductivity.
541 citations
TL;DR: The nanostructures deposited at room temperature in scanning tunneling microscopy experiments are produced by mechanical contact between tip and sample and the resistance can be as low as 100 εOmega.
Abstract: This paper shows that the nanostructures deposited at room temperature in scanning tunneling microscopy experiments are produced by mechanical contact between tip and sample. Gold mounds are deposited in gold substrates and it is observed that the current flowing between tip and sample is quantized and the resistance can be as low as 100 \ensuremath{\Omega}.
465 citations
TL;DR: It is shown that scanning tunneling microscopy (STM) images can be dominated by elastic deformations induced by atomic forces between tip and surface.
Abstract: We show that scanning tunneling microscopy (STM) images can be dominated by elastic deformations induced by atomic forces between tip and surface. New STM experiments on graphite (0001) showing a strong variation of the giant corrugation amplitudes with varying current at constant voltage are direct evidence of this atomic-force concept. Corrugations up to 8 A on a lateral scale of 2.4 A are associated with forces up to 10-8 N for compression and 2× 10-10 N for expansion.
293 citations
TL;DR: Measurements of room-temperature electronic transport in pulled metallic nanowires are presented, demonstrating that the conductance characteristics depend on the length, lateral dimensions, state and degree of disorder, and elongation mechanism of the wire.
Abstract: Material structures of reduced dimensions exhibit electrical and mechanical properties different from those in the bulk. Measurements of room-temperature electronic transport in pulled metallic nanowires are presented, demonstrating that the conductance characteristics depend on the length, lateral dimensions, state and degree of disorder, and elongation mechanism of the wire. Conductance during the elongation of short wires (length l ∼ 50 angstroms) exhibits periodic quantization steps with characteristic dips, correlating with the order-disorder states of layers of atoms in the wire predicted by molecular dynamics simulations. The resistance R of wires as long as l ∼ 400 angstroms exhibits localization characteristics with In R ( l ) ∼ l 2 .
284 citations
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Journal Article•
28,685 citations
TL;DR: The most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows, are described and some relevant procedures of the software are carried out.
Abstract: In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
6,996 citations
6,213 citations
TL;DR: Department of Materials Science, University of Patras, Greece, Theoretical and Physical Chemistry Institute, National Hellenic Research Foundation, and Dipartimento di Scienze Farmaceutiche, Universita di Trieste, Piazzale Europa 1, 34127 Triesteadays.
Abstract: Department of Materials Science, University of Patras, 26504 Rio Patras, Greece, Theoretical and Physical Chemistry Institute, National Hellenic Research Foundation, 48 Vass. Constantinou Avenue, 116 35 Athens, Greece, Institut de Biologie Moleculaire et Cellulaire, UPR9021 CNRS, Immunologie et Chimie Therapeutiques, 67084 Strasbourg, France, and Dipartimento di Scienze Farmaceutiche, Universita di Trieste, Piazzale Europa 1, 34127 Trieste, Italy
3,886 citations
TL;DR: The atomic force microscope (AFM) is not only used to image the topography of solid surfaces at high resolution but also to measure force-versus-distance curves as discussed by the authors, which provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities.
3,281 citations