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A. Van Pamel

Researcher at Imperial College London

Publications -  6
Citations -  94

A. Van Pamel is an academic researcher from Imperial College London. The author has contributed to research in topics: Finite element method & Ultrasonic testing. The author has an hindex of 3, co-authored 6 publications receiving 63 citations.

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Finite-element modelling of elastic wave propagation and scattering within heterogeneous media

TL;DR: The quantitative agreement is found to be excellent across previously unvisited scattering regimes; it is believed that this is the first quantitative validation of its kind which provides significant support towards the existence of the transitional scattering regime and facilitates future deployment of numerical methods for these problems.
Journal ArticleDOI

Numerical and analytic modelling of elastodynamic scattering within polycrystalline materials.

TL;DR: Comparison with the FE model demonstrates that the FFA provides a simple but satisfactory approximation, whereas the SOA shows all-around excellent agreement, and experimental wave velocity data evaluated against theSOA and SC reveal a better agreement when the Voigt reference is used in second order models.
Proceedings ArticleDOI

A finite element model investigation of ultrasonic array performance for inspecting polycrystalline materials

TL;DR: In this article, a Finite Element (FE) model is used to explore the different phenomena caused by grain scattering which may hinder detection of defects by an array, including multiple scattering and beam deviation due to anisotropy.
Proceedings ArticleDOI

Finite element modelling of wave propagation in highly scattering materials

TL;DR: In this article, a finite element modeling methodology is used to simulate wave propagation within polycrystalline materials and then applied to investigate the optimal configuration of an array inspecting such a material.
Proceedings ArticleDOI

High-speed GPU-based finite element simulations for NDT

TL;DR: The finite element method solved with explicit time increments is applied to three NDE examples, where the speed improvements are important: guided wave tomography, where a full 3D simulation must be run for each source transducer and every different defect size; scattering from rough cracks, where many simulations need to be run to build up a statistical model of the behaviour.