Showing papers by "Akira Kinbara published in 1965"
TL;DR: In this paper, the authors investigated the character of planar tensile stress in gold films by means of bending method and X-ray diffraction, and found that the stress increases with increasing film thickness.
Abstract: The character of a planar tensile stress (observed) in evaporated gold films has been investigated by means of bending method and X-ray diffraction. It has been found that stress increases with increasing film thickness in films thinner than 1000 A and approaches to a certain values of the order of 109 dyn/cm2 in thicker films. By annealing, the bending of the substrate increases, showing the increase of the stress in films but the X-ray diffraction shows that the stress in crystal grains in films decreases.
30 citations
TL;DR: In this paper, the irreversible changes in electrical resistance (time-decay) of gold films evaporated at room temperature were measured as a function of time to know the mechanism of the forming process of evaporated films.
Abstract: The irreversible changes in electrical resistance (time-decay) of gold films evaporated at room temperature were measured as a function of time to know the mechanism of the forming process of evaporated films. An experimental formula was derived for the change in electrical resistance. For the initial portions of the decay curves, the decay rate dR/dt was found to be proportional to (R-R∞)n, where n was almost independent of the evaporation rate. When the film thickness is 140 A±10 A, n is about 6.0 and it increases with increasing thickness. The mechanism of decay is understood as annihilation process of distortions generated in films during deposition. It is found that recombination theory and diffusion theory already proposed to explain the phenomenon are unsuitable to interprete the decay of the very initial stage of the film formation. It seems that much more complicated processes take place at this stage.
9 citations