Quantum cryptography could well be the first application of quantum mechanics at the individual quanta level. The very fast progress in both theory and experiments over the recent years are reviewed, with emphasis on open questions and technological issues.

Quantum Cryptography

Nanocrystals (NCs) discussed in this Review are tiny crystals of metals, semiconductors, and magnetic material consisting of hundreds to a few thousand atoms each. Their size ranges from 2-3 to about 20 nm. What is special about this size regime that placed NCs among the hottest research topics of the last decades? The quantum mechanical coupling * To whom correspondence should be addressed. E-mail: dvtalapin@uchicago.edu. † The University of Chicago. ‡ Argonne National Lab. Chem. Rev. 2010, 110, 389–458 389

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Prospects of Colloidal Nanocrystals for Electronic and Optoelectronic Applications

Memristive devices are electrical resistance switches that can retain a state of internal resistance based on the history of applied voltage and current. These devices can store and process information, and offer several key performance characteristics that exceed conventional integrated circuit technology. An important class of memristive devices are two-terminal resistance switches based on ionic motion, which are built from a simple conductor/insulator/conductor thin-film stack. These devices were originally conceived in the late 1960s and recent progress has led to fast, low-energy, high-endurance devices that can be scaled down to less than 10 nm and stacked in three dimensions. However, the underlying device mechanisms remain unclear, which is a significant barrier to their widespread application. Here, we review recent progress in the development and understanding of memristive devices. We also examine the performance requirements for computing with memristive devices and detail how the outstanding challenges could be met.

Memristive devices for computing

Phase-change materials are some of the most promising materials for data-storage applications. They are already used in rewriteable optical data storage and offer great potential as an emerging non-volatile electronic memory. This review looks at the unique property combination that characterizes phase-change materials. The crystalline state often shows an octahedral-like atomic arrangement, frequently accompanied by pronounced lattice distortions and huge vacancy concentrations. This can be attributed to the chemical bonding in phase-change alloys, which is promoted by p-orbitals. From this insight, phase-change alloys with desired properties can be designed. This is demonstrated for the optical properties of phase-change alloys, in particular the contrast between the amorphous and crystalline states. The origin of the fast crystallization kinetics is also discussed.

Phase-change materials for rewriteable data storage

http://www.cs.unibo.it/~montesi/CBD/Articoli/SurvyBigData2.pdf

Data-intensive applications, challenges, techniques and technologies: A survey on Big Data

A detailed investigation of electronic switching in chalcogenide-based phase-change memory devices is presented. An original bandgap model consistent with the microscopic structure of both crystalline and amorphous chalcogenide is described, and a physical picture of the switching mechanism is proposed. Numerical simulations provide, for the first time, a quantitative description of the peculiar current-voltage curve of a Ge/sub 2/Sb/sub 2/Te/sub 5/ resistor, in good agreement with measurements performed on test devices.

Electronic switching in phase-change memories

A detailed investigation of the reliability aspects in nonvolatile phase-change memories (PCM) is presented, covering the basic aspects related to high density array NVM, i.e., data retention, endurance, program and read disturbs. The data retention capabilities and the endurance characteristics of single PCM cells are analyzed, showing that data can be stored for 10 years at 110/spl deg/C and that a resistance difference of two order of magnitude between the cell states can be maintained for more than 10/sup 11/ programming cycles. The main mechanisms responsible for instabilities just before failure as well as for final device breakdown are also discussed. Finally, the impact of read and program disturbs are clearly assessed, showing with experimental data and simulated results that the crystallization induced during the cell read out and the thermal cross-talk due to adjacent bits programming do not affect the retention capabilities of the PCM cells.

Reliability study of phase-change nonvolatile memories

A detailed investigation of the time evolution for the low-field resistance R/sub off/ and the threshold voltage V/sub th/ in chalcogenide-based phase-change memory devices is presented. It is observed that both R/sub off/ and V/sub th/ increase and become stable with time and temperature, thus improving the cell readout window. Relying on a microscopic model, the drift of R/sub off/ and V/sub th/ is linked to the dynamic of the intrinsic traps typical of amorphous chalcogenides, thus providing for the first time a unified framework for the comprehension of chalcogenide materials transient behavior.

Low-field amorphous state resistance and threshold voltage drift in chalcogenide materials

Spectrally resolved absolute measurements of hot-carrier-induced photon emission in silicon are reported. In order to avoid uncertainties in geometrical and physical parameters, the simplest conceivable device, an avalanching p-n junction, was used. A photon emission efficiency of 2.9*10/sup 5/ photons with energy higher than 1.14 eV per carrier crossing the junction, independent of the lattice temperature down to 20 K, was measured. On the basis of these results the bremsstrahlung origin of the hot-carrier-induced light emission is critically reviewed. >

On the bremsstrahlung origin of hot-carrier-induced photons in silicon devices

The tuning curve of an LC-tuned voltage-controlled oscillator (VCO) substantially deviates from the ideal curve 1//spl radic/(LC(V)) when a varactor with an abrupt C(V) characteristic is adopted and the full oscillator swing is applied directly across the varactor. The tuning curve becomes strongly dependent on the oscillator bias current. As a result, the practical tuning range is reduced and the upconverted flicker noise of the bias current dominates the 1/f/sup 3/ close-in phase noise, even if the waveform symmetry has been assured. A first-order estimation of the tuning curve for MOS-varactor-tuned VCOs is provided. Based on this result, a simplified phase-noise model for double cross-coupled VCOs is derived. This model can be easily adapted to cover other LC-tuned oscillator topologies. The theoretical analyses are experimentally validated with a 0.25 /spl mu/m CMOS fully integrated VCO for 5 GHz wireless LAN receivers. By eliminating the bias current generator in a second oscillator, the close-in phase noise improves by 10 dB and features -70 dBc/Hz at 10 kHz offset. The 1/f/sup 2/ noise is -132 dBc/Hz at 3 MHz offset. The tuning range spans from 4.6 to 5.7 GHz (21%) and the current consumption is 2.9 mA.

Andrea L. Lacaita

Papers

Electronic switching in phase-change memories

Reliability study of phase-change nonvolatile memories

Low-field amorphous state resistance and threshold voltage drift in chalcogenide materials

On the bremsstrahlung origin of hot-carrier-induced photons in silicon devices

Frequency dependence on bias current in 5 GHz CMOS VCOs: impact on tuning range and flicker noise upconversion