scispace - formally typeset
A

Andrey I. Kukharenko

Researcher at Ural Federal University

Publications -  70
Citations -  670

Andrey I. Kukharenko is an academic researcher from Ural Federal University. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Oxide. The author has an hindex of 11, co-authored 60 publications receiving 428 citations. Previous affiliations of Andrey I. Kukharenko include Russian Academy of Sciences & Ural State Technical University.

Papers
More filters
Journal ArticleDOI

The characterization of Co-nanoparticles supported on graphene

TL;DR: In this article, the results of density functional theory calculations and measurements using X-ray photoelectron spectroscopy of Co-nanoparticles dispersed on graphene/Cu are presented.
Journal ArticleDOI

Surface characterisation and corrosion behaviour of niobium treated in a Ca- and P-containing solution under sparking conditions

TL;DR: In this paper, the growth of the oxide layers during the PEO treatment was monitored using a digital camera and the sparks formed on the surface of niobium were analyzed, and the effect of the anodisation voltage on the oxide layer thickness (from less than 1μm up to 150μm), incorporation of the electrolyte solution species (the relative content of Nb in the coatings dropped from 36.5 to 0.7 at%), adhesion strength (the Lc2 increased from 6.31−±-0.38 to 14.10−
Journal ArticleDOI

Surface characterisation of Ti-15Mo alloy modified by a PEO process in various suspensions.

TL;DR: The concentration of powder added to the solution changed the chemical composition and morphology of PEO coatings on the Ti-15Mo alloy surface, and calcium and phosphorous compounds were detected in the coatings formed on the substrate by the PEO process at 300V.
Journal ArticleDOI

Effect of post-annealing in air on optical and XPS spectra of Y2O3 ceramics doped with CeO2

TL;DR: In this paper, XPS data revealed the presence of mixed Ce3+ and Ce4+ states, while oxygen defect peak decreased after annealing owing to the defect elimination during oxygen diffusion into the highly defective ceramic.