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Author

Anupam Karmakar

Bio: Anupam Karmakar is an academic researcher from University of Calcutta. The author has contributed to research in topics: Chemical bath deposition & Nanowire. The author has an hindex of 12, co-authored 56 publications receiving 424 citations.


Papers
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Journal ArticleDOI
TL;DR: In this article, a thin film of p-type cupric oxide (p -CuO) is grown on silicon (n-Si) substrate by using chemical bath deposition (CBD) technique and a precise control of thickness from 60nm to 178nm has been achieved.

61 citations

Journal ArticleDOI
TL;DR: In this article, a detailed investigation of the effects of a spacer-drain overlap on the device characteristics of such silicon TFETs is reported, and it is demonstrated that a supersteep subthreshold swing and a significantly reduced off-state current IOFF can be achieved by appropriate designing of the spacer drain overlap.
Abstract: A tunnel field-effect transistor (FET) (TFET), in which the dominant carrier tunneling occurs in a direction that is in line with the gate electric field, shows great promise for sub-0.6-V operation. A detailed investigation, with the help of extensive device simulations, of the effects of a spacer-drain overlap on the device characteristics of such silicon TFET is reported in this paper. It is demonstrated that a supersteep subthreshold swing and a significantly reduced off-state current IOFF can be achieved by appropriate designing of the spacer-drain overlap. An investigation of the influence of the drain potential on the device characteristics reveals that the absence of a tunnel-resistance limited region results in long-channel metal-oxide-semiconductor FET-like output characteristics for such a structure. Short-channel effects, such as drain-induced barrier lowering, are also greatly suppressed in it. Results of the investigation on the scaling properties of such devices are also reported.

48 citations

Journal ArticleDOI
TL;DR: In this article, the impact of using a pocket either at the source end or at both the source and the drain ends of a Schottky barrier tunneling FET (SB-TFET) was investigated.
Abstract: It is known that a pocket at the drain end of a Schottky barrier tunneling FET (SB-TFET) helps to improve the device performance in terms of greatly suppressed ambipolar current and reduced drain-induced barrier lowering (DIBL) A detailed investigation, with the help of a numerical device simulator, of the impact of using such a pocket either at the source end or at both the source and the drain ends of an SB-TFET is reported for the first time in this paper The performance of the above-mentioned two devices is compared with a device having a pocket at the drain end and a conventional MOSFET Optimization of the barrier height and the pocket parameters is made before performance comparison It is observed that a pocket at the drain end helps suppress the ambipolar current and reduce both the subthreshold swing and the DIBL On the other hand, a pocket at the source end helps to improve the ON-state current \(I_{\mathrm{{\scriptstyle ON}}}\) Using a pocket at both the source and the drain ends results in overall improvement of the device performance The effects of scaling on such device performance parameters are also reported

46 citations

Journal ArticleDOI
15 Aug 2017-Talanta
TL;DR: This study sought to detect the presence of sucrose as an adulterant in selected honey varieties from different floral origins by employing EIS technique which has been simultaneously supported by Fourier Transform-Mid Infrared Spectroscopy measurements to provide a rapid, robust yet simple platform for honey quality evaluation.

40 citations

Journal ArticleDOI
TL;DR: In this paper, the CuO nano-powder has been synthesized by employing chemical bath deposition technique for its subsequent use to grow ultrathin film (20nm) of p-CuO on n-Si substrate for the fabrication of pCuO/n-Si hetero-junction diodes.

27 citations


Cited by
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01 Jan 2016
TL;DR: In this paper, a handbook of modern sensors physics designs and applications and applications are discussed. But instead of reading a good book with a cup of coffee in the afternoon, instead they juggled with some malicious bugs inside their laptop.
Abstract: Thank you for reading handbook of modern sensors physics designs and applications. As you may know, people have search hundreds times for their chosen readings like this handbook of modern sensors physics designs and applications, but end up in infectious downloads. Rather than reading a good book with a cup of coffee in the afternoon, instead they juggled with some malicious bugs inside their laptop.

249 citations

Journal ArticleDOI
TL;DR: In this paper, a new L-shaped gate tunnel field effect transistor (LG-TFET) is proposed and investigated by Silvaco Atlas simulation, and the gate and n+ pocket region overlap both in the vertical and the lateral directions resulting in an enhanced electric field.
Abstract: In this letter, a new L-shaped gate tunnel field-effect transistor (LG-TFET) is proposed and investigated by Silvaco Atlas simulation. The tunneling junction in the LG-TFET is perpendicular to the channel direction that facilitates the implementation of a relatively large tunneling junction area. The channel is U-shaped that makes the channel mainly distribute in the vertical direction, reducing the device area. The n+ pocket design is also introduced between the source and the intrinsic regions to improve the device characteristic. In addition, the gate and n+ pocket region overlap both in the vertical and the lateral directions resulting in an enhanced electric field, and the ON-state current of the LG-TFET is increased up to $\sim 50$ % compared with the previous L-shaped channel TFET. The minimum subthreshold swing of the LG-TFET is 38.5 mV/decade at 0.2 V gate-to-source voltage. By using the L-shaped gate, U-shaped channel, and the insertion of n+ pocket, the overall performance of the LG-TFET is optimized.

135 citations

Book ChapterDOI
01 Jan 2014
TL;DR: The European Food Safety Authority (EFSA) as discussed by the authors is the European Union agency responsible for the risk assessment of issues related to food and feed safety, and provides independent scientific advice to the European Commission, the European Parliament, and other institutions.
Abstract: The European Food Safety Authority (EFSA) is the European Union agency responsible for the risk assessment of issues related to food and feed safety. In close collaboration with national authorities, and taking into account the views of its stakeholders, EFSA provides independent scientific advice to the European Commission, the European Parliament, and other institutions, as well as clear communication on existing and emerging risks.

126 citations

Journal ArticleDOI
01 Oct 2018-Talanta
TL;DR: Vis-NIRS combined with chemometrics can be used for the rapid and non-destructive detection of honey adulteration and could be a useful tool for quality monitoring analysis in routine laboratories.

103 citations