Author
Arthur D. Friedman
Bio: Arthur D. Friedman is an academic researcher. The author has contributed to research in topics: Sequential logic & Combinational logic. The author has an hindex of 4, co-authored 10 publications receiving 3302 citations.
Papers
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01 Jan 1990
TL;DR: The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.
Abstract: For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.
2,758 citations
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01 Jan 1990
TL;DR: This chapter contains sections titled: Basic Issues ATG for SSFs in Combinational Circuits ATG in Sequential Circuits Concluding Remarks.
Abstract: This chapter contains sections titled: Basic Issues ATG for SSFs in Combinational Circuits ATG for SSFs in Sequential Circuits Concluding Remarks This chapter contains sections titled: References Problems
8 citations
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01 Jan 1990
TL;DR: In this article, the Bridging-Fault Model Detection of Nonfeedback Bridging Faults Detection of Feedback Bridging Fault Detection of feedback Bridging fault detection of feedback is discussed.
Abstract: This chapter contains sections titled: The Bridging-Fault Model Detection of Nonfeedback Bridging Faults Detection of Feedback Bridging Faults Bridging Faults Simulation Test Generation for Bridging Faults Concluding Remarks This chapter contains sections titled: References Problems
4 citations
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TL;DR: Experimental results obtained from a large number of benchmarks indicate that application of the proposed conflict analysis techniques to SAT algorithms can be extremely effective for aLarge number of representative classes of SAT instances.
Abstract: This paper introduces GRASP (Generic seaRch Algorithm for the Satisfiability Problem), a new search algorithm for Propositional Satisfiability (SAT). GRASP incorporates several search-pruning techniques that proved to be quite powerful on a wide variety of SAT problems. Some of these techniques are specific to SAT, whereas others are similar in spirit to approaches in other fields of Artificial Intelligence. GRASP is premised on the inevitability of conflicts during the search and its most distinguishing feature is the augmentation of basic backtracking search with a powerful conflict analysis procedure. Analyzing conflicts to determine their causes enables GRASP to backtrack nonchronologically to earlier levels in the search tree, potentially pruning large portions of the search space. In addition, by "recording" the causes of conflicts, GRASP can recognize and preempt the occurrence of similar conflicts later on in the search. Finally, straightforward bookkeeping of the causality chains leading up to conflicts allows GRASP to identify assignments that are necessary for a solution to be found. Experimental results obtained from a large number of benchmarks indicate that application of the proposed conflict analysis techniques to SAT algorithms can be extremely effective for a large number of representative classes of SAT instances.
1,482 citations
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10 Nov 1996TL;DR: Experimental results obtained from a large number of benchmarks, including many from the field of test pattern generation, indicate that application of the proposed conflict analysis techniques to SAT algorithms can be extremely effective for aLarge number of representative classes of SAT instances.
Abstract: This paper introduces GRASP (Generic seaRch Algorithm for the Satisfiability Problem), an integrated algorithmic framework for SAT that unifies several previously proposed search-pruning techniques and facilitates identification of additional ones. GRASP is premised on the inevitability of conflicts during search and its most distinguishing feature is the augmentation of basic backtracking search with a powerful conflict analysis procedure. Analyzing conflicts to determine their causes enables GRASP to backtrack non-chronologically to earlier levels in the search tree, potentially pruning large portions of the search space. In addition, by "recording" the causes of conflicts, GRASP can recognize and preempt the occurrence of similar conflicts later on in the search. Finally, straightforward bookkeeping of the causality chains leading up to conflicts allows GRASP to identify assignments that are necessary for a solution to be found. Experimental results obtained from a large number of benchmarks, including many from the field of test pattern generation, indicate that application of the proposed conflict analysis techniques to SAT algorithms can be extremely effective for a large number of representative classes of SAT instances.
951 citations
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01 Jan 1995TL;DR: This work examines the benefits and problems inherent in asynchronous computations, and in some of the more notable design methodologies, which include Huffman asynchronous circuits, burst-mode circuits, micropipelines, template-based and trace theory-based delay-insensitive circuits, signal transition graphs, change diagrams, and complication-based quasi-delay-insensitivity circuits.
Abstract: Asynchronous design has been an active area of research since at least the mid 1950's, but has yet to achieve widespread use. We examine the benefits and problems inherent in asynchronous computations, and in some of the more notable design methodologies. These include Huffman asynchronous circuits, burst-mode circuits, micropipelines, template-based and trace theory-based delay-insensitive circuits, signal transition graphs, change diagrams, and complication-based quasi-delay-insensitive circuits. >
622 citations
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TL;DR: Dart differs from previous approaches to diagnosis taken in the design-automation community in that it is more general and in many cases more efficient, and allows it to be applied to a wide class of devices ranging from digital logic to nuclear reactors.
598 citations
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01 Jul 2006
TL;DR: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time- to-volume.
522 citations