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B. E. Warren

Researcher at Massachusetts Institute of Technology

Publications -  17
Citations -  3600

B. E. Warren is an academic researcher from Massachusetts Institute of Technology. The author has contributed to research in topics: Silicon & Scattering. The author has an hindex of 14, co-authored 17 publications receiving 3439 citations.

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The structure of vitreous silica

TL;DR: In this paper, a new study of the structure of vitreous silica has been made under greatly improved conditions, using Rh Kα radiation with the method of fluorescence excitation, reliable intensity values were measured to 4π sinθ/λ = 20.
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X-Ray Diffraction in Random Layer Lattices

TL;DR: In this article, the authors considered random layer lattice structures, which consist of layers arranged parallel and equidistant, but random in translation parallel to the layer, and rotation about the normal.
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FOURIER ANALYSIS OF X‐RAY PATTERNS OF VITREOUS SiO2 AND B2O3*

TL;DR: In this paper, the X-ray scattering curves for vitreous SiO2 and B2O2 were obtained in a vacuum camera, using monochromatic Mo and Cu radiation.
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Fourier analysis of x‐ray patterns of soda‐silica glass

TL;DR: X-ray diffraction patterns were obtained for five compositions of soda-silica glass by using an evacuated camera, using MoKα radiation monochromated by reflection from rock salt as mentioned in this paper.
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X-ray diffraction study of soda-boric oxide glass *

TL;DR: In this article, X-ray diffraction patterns have been made of three samples of soda-boric oxide glass of the following molal compositions: 0.114 Na2O, 0.225 Na 2O, and 0.333 Na 2 O. The patterns were made in an evacuated camera using MoK α radiation monochromatic by reflection from rock salt.