B
B. Reichenberg
Researcher at Forschungszentrum Jülich
Publications - 16
Citations - 1618
B. Reichenberg is an academic researcher from Forschungszentrum Jülich. The author has contributed to research in topics: Piezoresponse force microscopy & Ferroelectricity. The author has an hindex of 10, co-authored 16 publications receiving 1553 citations.
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Journal ArticleDOI
Resistive switching mechanism of TiO2 thin films grown by atomic-layer deposition
Byung Joon Choi,Doo Seok Jeong,Seong Keun Kim,C. Rohde,Seol Choi,J. H. Oh,Honggon Kim,Cheol Seong Hwang,K. Szot,Rainer Waser,B. Reichenberg,S. Tiedke +11 more
TL;DR: In this article, the resistive switching mechanism of 20-to 57-nm-thick TiO2 thin films grown by atomic-layer deposition was studied by currentvoltage measurements and conductive atomic force microscopy.
Journal Article
原子層蒸着で成長したTiO 2 薄膜の抵抗スイッチング機構
Byung Joon Choi,Doo Seok Jeong,Seong Keun Kim,C. Rohde,Seol Choi,J. H. Oh,Honggon Kim,Cheol Seong Hwang,K. Szot,Rainer Waser,B. Reichenberg,S. Tiedke +11 more
Journal ArticleDOI
Piezoresponse in the light of surface adsorbates: Relevance of defined surface conditions for perovskite materials
TL;DR: In this article, the influence of a surface layer prevailing on perovskites on the piezoelectricity measured by piezoresponse force microscopy was investigated.
Journal ArticleDOI
Comparison of in-plane and out-of-plane optical amplification in AFM measurements
TL;DR: The in-plane image of piezoresponse force microscopy (PFM) generally exhibits a higher resolution and less noise than the out-of-plane images as mentioned in this paper.
Journal ArticleDOI
Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates
TL;DR: In this article, the impact of grain topography on the in-plane piezoelectric response at the perimeter of a BaTiO3 model was investigated. And the effect of an adsorbate layer on the response was quantified with typical material parameters.