B. Srinivasulu Naidu

TL;DR: In this paper, the chemical composition and structural and optical properties of thin films of vanadium pentoxide (V2O5) were investigated employing spectroscopic techniques, viz. X-ray photo-electron spectroscopy (XPS), inductively coupled plasma atomic emission spectrographs (ICP-AES), infrared spectrograms (IR), Raman spectrometers (RS), and optical spectro-graphs (OS).

TL;DR: In this article, the dc magnetron reactive sputtering of cadmium in an oxygen and argon atmosphere has been studied for their structural, electrical and optical properties, showing resistivity of 4.6×10−3 Ω cm, Hall mobility of 53 cm2/V s, carrier concentration of 3.5×1019 cm−3, with an optical transmission of 85% in the wavelength range 600-1600 nm and with a band gap of 2.46 eV.

TL;DR: In this article, the effect of sputtering pressure on the structural, electrical and optical properties of polycrystalline zinc oxide films was systematically studied and it was shown that the grain boundary scattering of the charge carriers is predominant in these films.

TL;DR: In this article, thin films of vanadium pentoxide were prepared by the electron-beam evaporation technique onto Corning 7059 glass and silicon substrates maintained at Ts=553 K by varying the oxygen partial pressure in the range of 20 mPa.

TL;DR: In this article, a dc reactive magnetron sputtering on glass substrates held at a fixed temperature of 623 K and at different oxygen partial pressures in 1×10 −4 −5× 10 −3 ǫmbar range was used to obtain thin films of cadmium oxide (CdO).