B
Bing Pan
Researcher at Beihang University
Publications - 143
Citations - 10602
Bing Pan is an academic researcher from Beihang University. The author has contributed to research in topics: Digital image correlation & Speckle pattern. The author has an hindex of 39, co-authored 131 publications receiving 8340 citations. Previous affiliations of Bing Pan include Beijing Institute of Technology & Tsinghua University.
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Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review
TL;DR: In this article, a review of the 2D digital image correlation (2D DIC) technique for displacement field measurement and strain field estimation is presented, and detailed analyses of the measurement accuracy considering the influences of both experimental conditions and algorithm details are provided.
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Study on subset size selection in digital image correlation for speckle patterns.
TL;DR: A theoretical model of the displacement measurement accuracy of DIC can be accurately predicted based on the variance of image noise and Sum of Square of Subset Intensity Gradients (SSSIG), which leads to a simple criterion for choosing an optimal subset size for the DIC analysis.
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Digital image correlation for surface deformation measurement: historical developments, recent advances and future goals
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Mean intensity gradient: An effective global parameter for quality assessment of the speckle patterns used in digital image correlation
Bing Pan,Zixing Lu,Huimin Xie +2 more
TL;DR: In this article, a simple and easy-to-calculate yet effective global parameter, called mean intensity gradient, is proposed for quality assessment of the speckle patterns used in DIC.
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Fast, Robust and Accurate Digital Image Correlation Calculation Without Redundant Computations
TL;DR: In this article, a Gauss-Newton-based digital image correlation (DIC) method was proposed to eliminate the redundant computations involved in conventional DIC method using forward additive matching strategy and classic Newton-Raphson (FA-NR) algorithm without sacrificing its sub-pixel registration accuracy.