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Bruce W. McGaughy

Researcher at Cadence Design Systems

Publications -  36
Citations -  806

Bruce W. McGaughy is an academic researcher from Cadence Design Systems. The author has contributed to research in topics: Model order reduction & Reduction (complexity). The author has an hindex of 16, co-authored 36 publications receiving 801 citations. Previous affiliations of Bruce W. McGaughy include University of California, Berkeley & University of California, Riverside.

Papers
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Proceedings ArticleDOI

An on-chip, attofarad interconnect charge-based capacitance measurement (CBCM) technique

TL;DR: In this article, a sensitive and simple technique for parasitic interconnect capacitance measurement with 0.0l fF or 10 aF sensitivity is presented, based upon an efficient test structure design.
Proceedings ArticleDOI

The energy efficiency of IRAM architectures

TL;DR: This work finds that IRAM memory hierarchies consume as little as 22% of the energy consumed by a conventional memory hierarchy for memory-intensive applications, while delivering comparable performance.
Patent

Systems and methods for efficiently simulating analog behavior of designs having hierarchical structure

TL;DR: In this paper, a method for building a hierarchical representation of a circuit for simulation is presented, where the source file contains SPICE-like netlist descriptions of the circuit in a flattened representation.
Proceedings ArticleDOI

Design tools for reliability analysis

TL;DR: A tools perspective is presented, including the primary effects such as HCI, NBTI and EM for which EDA tools are available, types of tools and necessary reliability infrastructure and flows that have been working in practice, and developing areas and future opportunities are addressed.
Journal ArticleDOI

A simple method for on-chip, sub-femto Farad interconnect capacitance measurement

TL;DR: In this paper, a sensitive and simple technique for parasitic interconnect capacitance measurement and extraction is presented, which is based upon an efficient test structure design that utilizes only two transistors in addition to the unknown interconnect capacity to be characterized.