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Bruce W. McGaughy
Researcher at Cadence Design Systems
Publications - 36
Citations - 806
Bruce W. McGaughy is an academic researcher from Cadence Design Systems. The author has contributed to research in topics: Model order reduction & Reduction (complexity). The author has an hindex of 16, co-authored 36 publications receiving 801 citations. Previous affiliations of Bruce W. McGaughy include University of California, Berkeley & University of California, Riverside.
Papers
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Proceedings ArticleDOI
An on-chip, attofarad interconnect charge-based capacitance measurement (CBCM) technique
TL;DR: In this article, a sensitive and simple technique for parasitic interconnect capacitance measurement with 0.0l fF or 10 aF sensitivity is presented, based upon an efficient test structure design.
Proceedings ArticleDOI
The energy efficiency of IRAM architectures
Richard Fromm,Stylianos Perissakis,Neal Cardwell,Christoforos Kozyrakis,Bruce W. McGaughy,David A. Patterson,Thomas Anderson,Katherine Yelick +7 more
TL;DR: This work finds that IRAM memory hierarchies consume as little as 22% of the energy consumed by a conventional memory hierarchy for memory-intensive applications, while delivering comparable performance.
Patent
Systems and methods for efficiently simulating analog behavior of designs having hierarchical structure
TL;DR: In this paper, a method for building a hierarchical representation of a circuit for simulation is presented, where the source file contains SPICE-like netlist descriptions of the circuit in a flattened representation.
Proceedings ArticleDOI
Design tools for reliability analysis
TL;DR: A tools perspective is presented, including the primary effects such as HCI, NBTI and EM for which EDA tools are available, types of tools and necessary reliability infrastructure and flows that have been working in practice, and developing areas and future opportunities are addressed.
Journal ArticleDOI
A simple method for on-chip, sub-femto Farad interconnect capacitance measurement
TL;DR: In this paper, a sensitive and simple technique for parasitic interconnect capacitance measurement and extraction is presented, which is based upon an efficient test structure design that utilizes only two transistors in addition to the unknown interconnect capacity to be characterized.