Carlos Robledo-Sanchez

Bio: Carlos Robledo-Sanchez is an academic researcher from Benemérita Universidad Autónoma de Puebla. The author has contributed to research in topics: Interferometry & Phase (waves). The author has an hindex of 13, co-authored 50 publications receiving 575 citations. Previous affiliations of Carlos Robledo-Sanchez include National Institute of Astrophysics, Optics and Electronics.

One-shot phase-shifting phase-grating interferometry with modulation of polarization: case of four interferograms.

Abstract: An experimental setup for optical phase extraction from 2-D interferograms using a one-shot phase-shifting technique able to achieve four interferograms with 90° phase shifts in between is presented. The system uses a common-path interferometer consisting of two windows in the input plane and a phase grating in Fourier plane as its pupil. Each window has a birefringent wave plate attached in order to achieve nearly circular polarization of opposite rotations one respect to the other after being illuminated with a 45° linear polarized beam. In the output, interference of the fields associated with replicated windows (diffraction orders) is achieved by a proper choice of the windows spacing with respect to the grating period. The phase shifts to achieve four interferograms simultaneously to perform phase-shifting interferometry can be obtained by placing linear polarizers on each diffraction orders before detection at an appropriate angle. Some experimental results are shown.

Edge effects with the Preston equation for a circular tool and workpiece

Abstract: In a polishing process the wear is greater at the edge when the tool extends beyond the border of the workpiece. To explain this effect, we propose a new model in which the pressure is higher at the edge. This model is applied to the case of a circular tool that polishes a circular workpiece. Our model correctly predicts that a greater amount of material is removed from the edge of the workpiece.

Theory and algorithms of an efficient fringe analysis technology for automatic measurement applications

Abstract: Some advances in fringe analysis technology for phase computing are presented. A full scheme for phase evaluation, applicable to automatic applications, is proposed. The proposal consists of: a fringe-pattern normalization method, Fourier fringe-normalized analysis, generalized phase-shifting processing for inhomogeneous nonlinear phase shifts and spatiotemporal visibility, and a phase-unwrapping method by a rounding-least-squares approach. The theoretical principles of each algorithm are given. Numerical examples and an experimental evaluation are presented.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

Abstract: A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Principles Of Optics Electromagnetic Theory Of Propagation Interference And Diffraction Of Light

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Digital wavefront measuring interferometer for testing optical surfaces and lenses

Abstract: A self-scanned 1024 element photodiode array and minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100. The photodiode array samples intensities over a 32 x 32 matrix in the interference pattern as the length of the reference arm is varied piezoelectrically. Using these data the minicomputer synchronously detects the phase at each of the 1024 points by a Fourier series method and displays the wavefront in contour and perspective plot on a storage oscilloscope in less than 1 min (Bruning et al. Paper WE16, OSA Annual Meeting, Oct. 1972). The array of intensities is sampled and averaged many times in a random fashion so that the effects of air turbulence, vibrations, and thermal drifts are minimized. Very significant is the fact that wavefront errors in the interferometer are easily determined and may be automatically subtracted from current or subsequent wavefrots. Various programs supporting the measurement system include software for determining the aperture boundary, sum and difference of wavefronts, removal or insertion of tilt and focus errors, and routines for spatial manipulation of wavefronts. FFT programs transform wavefront data into point spread function and modulus and phase of the optical transfer function of lenses. Display programs plot these functions in contour and perspective. The system has been designed to optimize the collection of data to give higher than usual accuracy in measuring the individual elements and final performance of assembled diffraction limited optical systems, and furthermore, the short loop time of a few minutes makes the system an attractive alternative to constraints imposed by test glasses in the optical shop.

Optical Shop Testing

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Abrasive fine-finishing technology

Abstract: Abrasive fine-finishing technology is often applied as a final finishing process, and the selection of the right technology is crucial to obtaining the desired performance of functions such as fatigue life. This paper begins with classifications of the technology along with fundamentals and brief histories of the individual methods. The material removal mechanisms, specific energies, and finishing characteristics of the various technologies are summarized giving assessments of the surfaces created by them. Guidelines developed for selecting the appropriate methods, and case studies illustrate the effectiveness of various methods. This paper ends with a discussion of the future prospects of the technology. (C) 2016