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Cecil E. Land

Bio: Cecil E. Land is an academic researcher from Sandia National Laboratories. The author has contributed to research in topics: Ferroelectricity & Thin film. The author has an hindex of 9, co-authored 13 publications receiving 1183 citations.

Papers
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Journal ArticleDOI
TL;DR: In this paper, transparent ferroelectric ceramic materials suitable for a variety of electrooptic applications were found in the quaternary (Pb,La,Zr,Ti)O3 system.
Abstract: Transparent ferroelectric ceramic materials suitable for a variety of electrooptic applications were found in the quaternary (Pb,La)(Zr,Ti)O3 system. These PLZT materials are prepared from mixed oxides and hot-pressed typically at 1100°C for 16 h at 2000 psi. Modifying the lead zirconate-titanate system with lanthana linearly reduces the Curie point with increasing lanthana. Transmission measurements in the visible and infrared show that these materials exhibit a nearly constant response from the absorption edge of 0.37 μ to ∼6 μm. The highest transmission values, essentially 100% (neglecting reflection losses of ∼18%) for thin polished plates, were noted for compositions containing 8 at.% La or more. Specific compositions within the system display electrooptic memory or conventional linear or quadratic electrooptic effects; on the basis of the magnitude of the electrooptic effects, they compare quite favorably with single crystals.

1,002 citations

Journal ArticleDOI
TL;DR: In this paper, the authors used the photocurrent generated rather than the reduction in coercive voltage (as in bulk ceramics) when the film is exposed to light to measure the longitudinal electrooptic effects and the photosensitivities of the films.
Abstract: The feasibility of storing and reading high-density optical information in lead zirconate titanate (PZT) and in lead lanthanum zirconate titanate (PLZT) thin films depends on both the longitudinal electrooptic coefficients and the photosensitivities of the films. This paper describes the methods used to measure the longitudinal electrooptic effects and the photosensitivities of the films. The results of these measurements were used to evaluate a longitudinal quadratic electrooptic R coefficient, a longitudinal linear electrooptic rc coefficient, and the wavelength dependence of the photosensitivity of a composition of PZT polycrystalline thin film. The longitudinal electrooptic R and rc coefficients are about an order of magnitude less than the transverse R and rc coefficients of bulk ceramics of similar compositions. This is attributed to clamping of the film by the rigid substrate. The large birefringence of the films after poling (>10−2) suggests that the optic axes of the films are preferentially oriented normal to the film surface. The techniques used in this paper for evaluating the photosensitivities of thin films are based on measuring the photocurrent generated rather than the reduction in coercive voltage (as in bulk ceramics) when the film is exposed to light. The thin film photosensitivities appear to be significantly higher than those of bulk ceramics of similar compositions. The high photosensitivities coupled with the substantial longitudinal electrooptic coefficients combine to establish the feasibility of using PZT or PLZT thin films for optical information storage applications.

61 citations

Journal ArticleDOI
TL;DR: In this paper, the photostorage effect in antiferroelectric-phase (AFE-phase) lead lanthanum zirconate titanate (PLZT) compositions appears to be particularly applicable to binary optical information storage.
Abstract: A recently discovered photostorage effect in antiferroelectric-phase (AFE-phase) lead lanthanum zirconate titanate (PLZT) compositions appears to be particularly applicable to binary optical information storage. The basis for bistable optical information storage is that exposure to near-UV or visible light shifts the electric field threshold of the phase transition between the field-induced ferroelectric (FE) phase and the stable AFE phase in the direction of the initial AFE /yields/ FE phase transition. Properties of this photoactivated shift of the FE /yields/ AFE phase transition, including preliminary photosensitivity measurements and photostorage mechanisms, are presented. Photosensitivity enhancement by ion implantation is also discussed.

30 citations

Journal ArticleDOI
TL;DR: In this paper, a PLZT thin film device has been constructed in which the photoinduced current represents the dot product between a stored image and an image projected onto its surface, and one-dimensional autocorrelations have been performed by measuring this current while displacing the projected image.
Abstract: A PLZT thin film device has been constructed in which the photoinduced current represents the dot product between a stored image and an image projected onto its surface. One-dimensional autocorrelations have been performed by measuring this current while displacing the projected image. This device has the potential to perform as a high-resolution, high-speed optical comparator.

28 citations

Journal ArticleDOI
TL;DR: In this paper, the authors reported that both the near-UV and the visible photosensitivities of PLZT (lead lanthanum zirconate titanate) ceramics are increased by as much as four orders of magnitude by ion implantation or a combination of thermal diffusion.
Abstract: We reported in previous papers that both the near-UV and the visible photosensitivities of ferroelectric-phase PLZT (lead lanthanum zirconate titanate) ceramics are increased by as much as four orders of magnitude by ion implantation or a combination of thermal diffusion of Al and ion implantation. New results are presented here on high-energy (1 MeV) implants of Al and Ni and coimplants of Al+Ne and Ni+Ne, and these results are compared with earlier 500 keV implants of Al and Cr and coimplants of Al+Ne and Cr+Ne as surface modification techniques for increasing the visible photosensitivity of PLZT. The important role of grain size in determining optimum contrast and resolution of stored optical information is described in terms of new experimental results.

20 citations


Cited by
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Journal ArticleDOI
TL;DR: Ferroelectric ceramics have been the heart and soul of several multibillion dollar industries, ranging from high-dielectric-constant capacitors to later developments in piezoelectric transducers, positive temperature coefficient devices, and electrooptic light valves as mentioned in this paper.
Abstract: Ferroelectric ceramics were born in the early 1940s with the discovery of the phenomenon of ferroelectricity as the source of the unusually high dielectric constant in ceramic barium titanate capacitors. Since that time, they have been the heart and soul of several multibillion dollar industries, ranging from high-dielectric-constant capacitors to later developments in piezoelectric transducers, positive temperature coefficient devices, and electrooptic light valves. Materials based on two compositional systems, barium titanate and lead zirconate titanate, have dominated the field throughout their history. The more recent developments in the field of ferroelectric ceramics, such as medical ultrasonic composites, high-displacement piezoelectric actuators (Moonies, RAINBOWS), photostrictors, and thin and thick films for piezoelectric and integrated-circuit applications have served to keep the industry young amidst its growing maturity. Various ceramic formulations, their form (bulk, films), fabrication, function (properties), and future are described in relation to their ferroelectric nature and specific areas of application.

3,442 citations

Journal ArticleDOI
TL;DR: In this article, the dielectric relaxation of a solid solution of lead titanate in lead magnesium niobate is found to be similar to the magnetic relaxation in spin-glass systems.
Abstract: The dielectric relaxation of a solid solution of 10‐mol % lead titanate in lead magnesium niobate is found to be similar to the magnetic relaxation in spin‐glass systems.1–3 Based on this analogy, it is proposed that the relaxor ferroelectric is a polar‐glassy system which has thermally activated polarization fluctuations above a static freezing temperature. An activation energy and freezing temperature of 0.0407 eV and 291.5 K, respectively, were found by analyzing the frequency dependence of the temperature of the dielectric maximum using the Vogel–Fulcher relationship.4,5 It has also been shown that a macroscopic polarization is sustained on heating up to this freezing temperature. A coupling between nanometer scale clusters is believed to control the kinetics of the fluctuations and the development of a frustration as the system freezes into states of local equilibrium. The possibility of an orientational freezing associated with the ferroelastic nature of the nanosized polar regions in the rhombohedr...

1,148 citations

Book
02 Dec 2015
TL;DR: A comprehensive review of the extractive metallurgy of rare earths can be found in this article, where the topics covered are: world rare earth resources and production; ore processing and separation of individual rare earth elements; reduction, refining, and ultrapurification of rare Earth elements; methods for rare earth materials analysis; and a selection of the numerous rare earth applications.
Abstract: A comprehensive review is presented of the extractive metallurgy of rare earths. The topics covered are: world rare earth resources and production; ore processing and separation of individual rare earths; reduction, refining, and ultrapurification of rare earth elements; methods for rare earth materials analysis; and a selection of the numerous rare earth applications. World rare earth reserves are abundant and would last for well beyond the next century. However, all of the 16 naturally occurring rare earth elements are not equally distributed in the ore minerals. This, compounded with the problems specific to the isolation and recovery of each of the rare earths, sets the stage for an unequal rare earth availability. The close chemical similarity of rare earths looses its importance when divergent physical properties determine the processes for rare earth element reduction and refining. The rare earth metals, alloys, and compounds have been as pure as could be determined. Finally, the commercial...

1,025 citations

Journal ArticleDOI
TL;DR: In this article, a review of the relaxational properties of random-site electric dipoles in dielectrics is presented, including the role of pressure and applied dc biasing electric fields in understanding the physics of these materials including the R-to-FE crossover.
Abstract: Random lattice disorder produced by chemical substitution in ABO3 perovskites can lead to the formation of dipolar impurities and defects that have a profound influence on the static and dynamic properties of these materials that are the prototypical soft ferroelectric (FE) mode systems. In these highly polarizable host lattices, dipolar entities form polar nanodomains whose size is determined by the dipolar correlation length, rc, of the host and that exhibit dielectric relaxation in an applied ac field. In the very dilute limit (< 0.1at.%) each domain behaves as a non-interacting dipolar entity with a single relaxation time. At higher concentrations of disorder, however, the domains can interact leading to more complex relaxational behaviour. Among the manifestations of such behaviour is the formation of a glass-like relaxor (R) state, or even an ordered FE state for a sufficiently high concentration of overlapping domains. After a brief discussion of the physics of random-site electric dipoles in dielectrics, this review begins with the simplest cases, namely the relaxational properties of substitutional impurities (e.g., Mn, Fe and Ca) in the quantum paraelectrics KTaO3 and SrTiO3. This is followed by discussions of the relaxational properties of Li-and Nb-doped KTaO3 and of the strong relaxors in the PbMg1/3Nb2/3O3 and La-substituted PbZr1−xTixO3 families. Some emphasis will be on the roles of pressure and applied dc biasing electric fields in understanding the physics of these materials including the R-to-FE crossover.

681 citations

Journal ArticleDOI
TL;DR: In this article, a crack-free transparent ferroelectric polycrystalline Pb(Zr,Ti)O3 thin films were prepared by spin-coating solutions of complex alkoxides.
Abstract: Crack‐free transparent ferroelectric polycrystalline Pb(Zr,Ti)O3 thin films were prepared by spin‐coating solutions of complex alkoxides. The preparation of stock solution, firing, and annealing of films was described. The coating of the intermediate layer of Al2O3 increased the adhesion between Pb(Zr,Ti)O3 thin films and glass substrates. The crystalline phases of films with varying Zr/Ti ratios were investigated. The dielectric constants were about 260. The remanent polarization and coercive field were 6.6 μC/cm2 and 26.7 kV/cm, respectively. The refractive index of the perovskite Pb(Zr,Ti)O3 films was 2.6 at 6328 A, and the absorption edge was at 3400 A. The quadratic and linear electro‐optic effects were measured with respect to the Zr/Ti ratio from 40/60 to 60/40 for films grown on glass substrates. The quadratic and linear electro‐optic coefficients were about 1×10−18 m2 /V2 and 2.4×10−11 m/V at 6328 A, respectively.

608 citations