Fast Fourier Transform

The main characteristic of Reconfigurable Computing is the presence of hardware that can be reconfigured to implement specific functionality more suitable for specially tailored hardware than on a simple uniprocessor. Reconfigurable computing systems join microprocessors and programmable hardware in order to take advantage of the combined strengths of hardware and software and have been used in applications ranging from embedded systems to high performance computing. Many of the fundamental theories have been identified and used by the Hardware/Software Co-Design research field. Although the same background ideas are shared in both areas, they have different goals and use different approaches.This book is intended as an introduction to the entire range of issues important to reconfigurable computing, using FPGAs as the context, or "computing vehicles" to implement this powerful technology. It will take a reader with a background in the basics of digital design and software programming and provide them with the knowledge needed to be an effective designer or researcher in this rapidly evolving field.

· Treatment of FPGAs as computing vehicles rather than glue-logic or ASIC substitutes
· Views of FPGA programming beyond Verilog/VHDL
· Broad set of case studies demonstrating how to use FPGAs in novel and efficient ways

Reconfigurable Computing: The Theory and Practice of FPGA-Based Computation

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

Introduction to finite fields and their applications: Preface

Design and Analysis ofFault-Tolerant Digital Systems: B. W. JOHNSON (Addison Wesley, 1989,577 pp., £41.35) The book provides an introduction to the important aspects of designing fault-tolerant systems, and an evaluation of how well the reliability goals have been achieved. The book is mainly oriented towards a final year undergraduate course on fault-tolerant computing, primarily with an implementation bias. In chapters 1 and 2, definitions and basic terminology are covered, which sets the stage for the remaining chapters, and provides the background and motivation for the remainder of the book. Chapter 3 provides a thorough analysis of fault-tolerance techniques and concepts. This chapter in particular is remarkably well written, covering the issues of hardware and information redundancy, which form the mainstay offault-tolerant computing. Subsequent chapters on the use and evaluation of the various approaches illustrate the principles as they have been put into practice. At the end of chapter 5, small projects that allow the reader to apply the material presented in the preceding chapters are included. The resurgence of interest in fault-tolerance with the emergence of VLSI is the theme of chapter 6, focussing on designing fault-tolerant systems in a VLSI environment. The problems and opportunities presented by VLSI are discussed and the use of redundancy techniques in order to enhance manufacturing yield and to provide in-service reliability are reviewed. The final chapter covers testing, design for testability and testability analysis, which must be considered during each phase of the design process to guarantee that resulting designs can be thoroughly tested. Each chapter is followed by a summary of the key issues and concepts presented therein, and a separate list of references, which makes it easily readable. In addition, there is a reading list with more comprehensive and specialised references devoted to each chapter. Overall, the book is well written, and contains a great deal of information in 577 pages. The book has a definite implementation bias, and draws considerably on the author's experience in industry, particularly reflected in the projects accompanying chapter 5. The book should be a useful addition to a library, and a suitable text to accompany a lecture course on fault-tolerant computing. R. RAMASWAMI, Department ofComputation, UMIST

Book Review: Design and Analysis of Fault-Tolerant Digital SystemsDesign and Analysis of Fault-Tolerant Digital Systems: JohnsonB. W. (Addison Wesley, 1989, 577 pp., £41.35)

Preface. About the Author. 1. An Overview of BIST. 2. Fault Models, Detection, and Simulation. 3. Design for Testability. 4. Test Pattern Generation. 5. Output Response Analysis. 6. Manufacturing and System-Level Use of BIST. 7. Built-In Logic Block Observer. 8. Pseudo-Exhaustive BIST. 9. Circular BIST. 10. Scan-Based BIST. 11. Non-Intrusive BIST. 12. BIST for Regular Structures. 13. BIST for FPGAs and CPLDs. 14. Applying Digital BIST of Mixed-Signal Systems. 15. Merging BIST and Concurrent Fault Detection. Acronyms. Bibliography. Index.

A Designer’s Guide to Built-In Self-Test

We introduce the first BIST approach for testing the programmable routing network in FPGAs. Our method detects opens in, and shorts among, wiring segments, and also faults affecting the programmable switches that configure the FPGA interconnect. As a result, the BIST technique provides complete testing of interconnect faults.

Built-in self-test of FPGA interconnect

We present a new approach for Field Programmable Gate Array (FPGA) testing that exploits the reprogrammability of FPGAs to create Built-In Self-Test (BIST) logic only during off-line test. As a result, BIST is achieved without any area overhead or performance penalties to the system function implemented by the FPGA. Our approach is applicable to all levels of testing, achieves maximal fault coverage, and all tests are applied at-speed. We describe the BIST architecture used to test all the programmable logic blocks in an FPGA and the configurations required to implement our approach using a commercial FPGA. We also discuss implementation problems caused by CAD tool limitations and limited architectural resources, and we describe techniques which overcome these limitations.

Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!)

In this paper we present an on-line, multi-level fault tolerant (FT) technique for system functions and applications mapped to partially and dynamically reconfigurable FPGAs. Our method is based on the roving self testing areas (STARs) fault detection/location strategy presented in Abramovici et al. (1999). In STARs, the area under test uses partial reconfiguration properties to modify the configuration of the area under test without affecting the configuration of the system function and dynamic reconfiguration properties to allow uninterrupted execution of the system function while reconfiguration takes place. In this paper we take this one step further. Once a fault (or multiple faults) is detected we dynamically reconfigure the working area application around the fault with no additional system function interruption (other than the interruption when a STAR moves to a new location). We also apply the concept of partially usable blocks to increase fault tolerance. Our method has been successfully implemented and demonstrated on the ORCA 2CA series FPGAs from Lucent Technologies.

Dynamic fault tolerance in FPGAs via partial reconfiguration

We present a built-in self-test (BIST) approach able to detect and accurately diagnose all single and practically all multiple faulty programmable logic blocks (PLBs) in field programmable gate arrays (FPGAs) with maximum diagnostic resolution. Unlike conventional BIST, FPGA BIST does not involve any area overhead or performance degradation. We also identify and solve the problem of testing configuration multiplexers that was either ignored or incorrectly solved in most previous work. We introduce the first diagnosis method for multiple faulty PLBs; for any faulty PLB, we also identify its internal faulty modules or modes of operation. Our accurate diagnosis provides the basis for both failure analysis used for yield improvement and for any repair strategy used for fault-tolerance in reconfigurable systems. We present experimental results showing detection and identification of faulty PLBs in actual defective FPGAs. Our BIST architecture is easily scalable.

Charles E. Stroud

Papers

A Designer’s Guide to Built-In Self-Test

Built-in self-test of FPGA interconnect

Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!)

Dynamic fault tolerance in FPGAs via partial reconfiguration

BIST-based test and diagnosis of FPGA logic blocks : Reconfigurable and Adaptive VLSI Systems