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Christina Åkerlind
Researcher at Swedish Defence Research Agency
Publications - 18
Citations - 189
Christina Åkerlind is an academic researcher from Swedish Defence Research Agency. The author has contributed to research in topics: Emissivity & Radiative cooling. The author has an hindex of 7, co-authored 15 publications receiving 105 citations. Previous affiliations of Christina Åkerlind include Linköping University.
Papers
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Proceedings ArticleDOI
A review of materials for spectral design coatings in signature management applications
TL;DR: The current focus in Swedish policy towards national security and high-end technical systems, together with a rapid development in multispectral sensor technology, adds to the utility of developing....
Proceedings ArticleDOI
Evaluation criteria for spectral design of camouflage
TL;DR: The ladder step previous to digging into the different material composition possibilities and choice of suitable materials and structures includes the object signature and decision of what the spectral response should be, when intended for a specific environment, part of the theme of this paper.
Proceedings ArticleDOI
Optical polarization - Background and Camouflage
Christina Åkerlind,Christina Åkerlind,T. Hallberg,Johan Eriksson,Hans Kariis,David Bergström +5 more
TL;DR: Polarimetric imaging sensors in the electro-optical region, already military and commercially available in both the visual and infrared, show enhanced capabilities for advanced target detection and detection.
Journal ArticleDOI
Exploring optics of beetle cuticles with Mueller-matrix ellipsometry
Hans Arwin,Roger Magnusson,Lía Fernández del Río,Christina Åkerlind,Christina Åkerlind,Eloy Muñoz-Pineda,Jan Landin,Arturo Mendoza-Galván,Arturo Mendoza-Galván,Kenneth Järrendahl +9 more
TL;DR: Spectroscopic Mueller-matrix ellipsometry at variable angles of incidence is applied to beetle cuticles using a small (50 -100 μm) spot size as discussed by the authors, demonstrating how ellipticity and degree of polarization of the reflected light can be derived from a Mueller matrix providing a detailed insight into reflection properties.