Author
D. Horne
Bio: D. Horne is an academic researcher. The author has contributed to research in topics: Frequency modulation & Cantilever. The author has an hindex of 2, co-authored 2 publications receiving 3974 citations.
Papers
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TL;DR: In this article, a frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more, which is made possible by operating in a moderate vacuum (<10−3 Torr).
Abstract: A new frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more. Increased sensitivity is made possible by operating in a moderate vacuum (<10−3 Torr), which increases the Q of the vibrating cantilever. In the FM technique, the cantilever serves as the frequency determining element of an oscillator. Force gradients acting on the cantilever cause instantaneous frequency modulation of the oscillator output, which is demodulated with a FM detector. Unlike conventional ‘‘slope detection,’’ the FM technique offers increased sensitivity through increased Q without restricting system bandwidth. Experimental comparisons of FM detection in vacuum (Q∼50 000) versus slope detection in air (Q∼100) demonstrated an improvement of more than 10 times in sensitivity for a fixed bandwidth. This improvement is evident in images of magnetic transitions on a thin‐film CoPtCr magnetic disk. In the future, the increased sensitivi...
2,155 citations
01 Jan 2001
TL;DR: In this paper, a frequency modulation (FM) technique has been demonstrated which ennances the sensitivity of attractive mode force microscopy by an order of magnitude or more, which is made possible by operating in a moderate vacuum ( < 10 ’ Torr).
Abstract: A new frequency modulation (FM) technique has been demonstrated which ennances the sensitivity of attractive mode force microscopy by an order of magnitude or more. Increased sensitivity is made possible by operating in a moderate vacuum ( < 10 ’ Torr), which increases the Q of the vibrating cantilever. In the FM technique, the cantilever serves as the frequency determining element of an oscillator. Force gradients acting on the cantilever cause instantaneous frequency modulation of the oscillator output, which is demodulated with a FM detector. Unlike conventional “slope detection,” the FM technique offers increased sensitivity through increased Q without restricting system bandwidth. Experimental comparisons of FM detection in vacuum (Q50 000) versus slope detection in air (Q100) demonstrated an improvement of more than 10 times in sensitivity for a fixed bandwidth. This improvement is evident in images of magnetic transitions on a thin-film CoPtCr magnetic disk. In the future, the increased sensitivity offered by this technique should extend the range of problems accessible by force microscopy.
1,916 citations
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TL;DR: Titanium dioxide is the most investigated single-crystalline system in the surface science of metal oxides, and the literature on rutile (1.1) and anatase surfaces is reviewed in this paper.
7,056 citations
Book•
01 Jan 2006TL;DR: In this paper, the authors proposed a method for propagating and focusing of optical fields in a nano-optics environment using near-field optical probes and probe-sample distance control.
Abstract: 1. Introduction 2. Theoretical foundations 3. Propagation and focusing of optical fields 4. Spatial resolution and position accuracy 5. Nanoscale optical microscopy 6. Near-field optical probes 7. Probe-sample distance control 8. Light emission and optical interaction in nanoscale environments 9. Quantum emitters 10. Dipole emission near planar interfaces 11. Photonic crystals and resonators 12. Surface plasmons 13. Forces in confined fields 14. Fluctuation-induced phenomena 15. Theoretical methods in nano-optics Appendices Index.
3,772 citations
TL;DR: The atomic force microscope (AFM) is not only used to image the topography of solid surfaces at high resolution but also to measure force-versus-distance curves as discussed by the authors, which provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities.
3,281 citations
TL;DR: The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation AFM (FM-AFM), as well as other dynamic methods as discussed by the authors.
Abstract: This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force microscopy (FM-AFM). This technique, as well as other dynamic methods, is explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened our theoretical understanding of frequency-modulation atomic force microscopy. Consequently spatial resolution and ease of use have been increased dramatically. Vacuum atomic force microscopy opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms.
1,948 citations
TL;DR: In this paper, the authors review the fundamentals, applications and future tendencies of dynamic atomic force microscopy (AFM) methods and present a detailed quantitative comparison between theoretical simulations and experiment.
1,908 citations