Daesuk Kim

Bio: Daesuk Kim is an academic researcher from Chonbuk National University. The author has contributed to research in topics: Digital holography & Interferometry. The author has an hindex of 16, co-authored 68 publications receiving 848 citations. Previous affiliations of Daesuk Kim include KAIST & University of Connecticut.

Single-shot, dual-wavelength digital holography based on polarizing separation

Abstract: We describe what we believe to be a new digital holographic configuration that can be utilized for both single-shot, dual-wavelength, off-axis geometry and imaging polarimetry. To get the feasibility of the single-shot, dual-wavelength, off-axis geometry, a sample with a nominal step height of 1.34 μm is used. Undesirable noises that strongly affect the measurement have been suppressed successfully by using a modified flat fielding method for the dual-wavelength scheme. And also, the experiment is conducted on a nanopattern sample on the basis of a single image acquisition to show the imaging polarimetry capability. The proposed scheme can provide a real-time solution for measuring three-dimensional objects having a high abrupt height difference with moderate accuracy. Furthermore, it can be used as a fast polarization imaging measurement tool.

Three-dimensional-object recognition by use of single-exposure on-axis digital holography

Abstract: On-axis phase-shifting digital holography requires recording of multiple holograms. We describe a novel real-time three-dimensional- (3-D-) object recognition system that uses single-exposure on-axis digital holography. In contrast to 3-D-object recognition by means of a conventional phase-shifting scheme that requires multiple exposures, our proposed method requires only a single digital hologram to be synthesized and used to recognize 3-D objects. A benefit of the proposed 3-D recognition method is enhanced practicality of digital holography for 3-D recognition in terms of its simplicity and greater robustness to external scene parameters such as moving targets and environmental noise factors. We show experimentally the utility of the single-exposure on-axis digital holography–based 3-D-object recognition method.

Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunable filter

Abstract: A simultaneous volumetric thickness-profile measurement method based on an acousto-optic tunable filter for transparent film deposited upon pattern structures is described. The nondestructive thickness profilometer prevents the destruction of samples such as one encounters in using a scanning-electron microscope and provides good accuracy. The information on the volumetric thickness profile is obtained through least-squares fitting with a phase model, ϕmodelk=2kh+ψk,d+(offset), which has three unknowns: surface profile h, thickness d, and an indeterminate initial phase offset. Accurate phase information in the spectral domain can be obtained by introduction of the concept of spectral carrier frequency. Experimental results for a metal patterned sample show that the volumetric thickness profile can be determined within an error range of ∼10 nm.

Two-wavelength in-line phase-shifting interferometry based on polarizing separation for accurate surface profiling

Abstract: We describe a configuration that can be used for two-wavelength phase-shifting in-line interferometry based on polarizing separation. The experiment is conducted on a sample with a step height of 1.34 μm nominally. In this paper, five- and seven-phase step algorithms have been compared for their effectiveness in reducing the noise in the phase maps. The noise is further reduced by the application of the flat fielding method. The recorded interferograms are processed using seven-phase step algorithm to obtain the phase map for each wavelength separately. The independent phase maps are subtracted and a phase map for the beat-wavelength is obtained and converted to height map. The results extracted from the seven-phase step algorithm have been compared with the results extracted from the single shot off-axis geometry and the results are in agreement.

Distortion-tolerant 3-D object recognition by using single exposure on-axis digital holography

Abstract: Disclosed herein is a method, system and computer readable medium for a distortion-tolerant 3-D object recognition that may include recording a single exposure digital hologram of a 3D object on a sensor by on-axis digital holography; representing the recorded single exposure digital hologram mathematically as a synthesized hologram and as a reconstructed complex wave function of the 3D object; repeating the steps above for at least one comparison 3D object and obtaining a comparison reconstructed complex wave function of the comparison 3D object; and constructing a correlation filter for 3D distortion-tolerant object recognition from the reconstructed complex wave function of the 3D object and from the at least one comparison reconstructed complex wave function of the comparison 3D object also recorded; and correlating the reconstructed complex wave function of the 3D object to the comparison reconstructed complex wave function of the comparison 3D object using the correlation filter in order to recognize 3D objects.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

Abstract: A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Digital wavefront measuring interferometer for testing optical surfaces and lenses

Abstract: A self-scanned 1024 element photodiode array and minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100. The photodiode array samples intensities over a 32 x 32 matrix in the interference pattern as the length of the reference arm is varied piezoelectrically. Using these data the minicomputer synchronously detects the phase at each of the 1024 points by a Fourier series method and displays the wavefront in contour and perspective plot on a storage oscilloscope in less than 1 min (Bruning et al. Paper WE16, OSA Annual Meeting, Oct. 1972). The array of intensities is sampled and averaged many times in a random fashion so that the effects of air turbulence, vibrations, and thermal drifts are minimized. Very significant is the fact that wavefront errors in the interferometer are easily determined and may be automatically subtracted from current or subsequent wavefrots. Various programs supporting the measurement system include software for determining the aperture boundary, sum and difference of wavefronts, removal or insertion of tilt and focus errors, and routines for spatial manipulation of wavefronts. FFT programs transform wavefront data into point spread function and modulus and phase of the optical transfer function of lenses. Display programs plot these functions in contour and perspective. The system has been designed to optimize the collection of data to give higher than usual accuracy in measuring the individual elements and final performance of assembled diffraction limited optical systems, and furthermore, the short loop time of a few minutes makes the system an attractive alternative to constraints imposed by test glasses in the optical shop.

Polarization-sensitive low-coherence reflectometer for birefringence characterization and ranging

Abstract: We present a polarization-sensitive optical coherence-domain reflectometer capable of characterizing the phase retardation between orthogonal linear polarization modes at each reflection point in a birefringent sample. The device is insensitive to the rotation of the sample in the plane perpendicular to ranging. Phase measurement accuracy is ±0.86°, but the reflectometer can distinguish local variations in birefringence as small as 0.05° with a distance resolution of 10.8 μm and a dynamic range of 90 dB. Birefringence-sensitive ranging in a wave plate, an electro-optic modulator, and a calf coronary artery is demonstrated.

Digital spatially incoherent Fresnel holography.

Abstract: We present a new method for recording digital holograms under incoherent illumination. Light is reflected from a 3D object, propagates through a diffractive optical element (DOE), and is recorded by a digital camera. Three holograms are recorded sequentially, each for a different phase factor of the DOE. The three holograms are superposed in the computer, such that the result is a complex-valued Fresnel hologram. When this hologram is reconstructed in the computer, the 3D properties of the object are revealed.

General theoretical formulation of image formation in digital Fresnel holography

Abstract: We present a detailed analysis of image formation in digital Fresnel holography. The mathematical modeling is developed on the basis of Fourier optics, making possible the understanding of the different influences of each of the physical effects invoked in digital holography. Particularly, it is demonstrated that spatial resolution in the reconstructed plane can be written as a convolution product of functions that describe these influences. The analysis leads to a thorough investigation of the effect of the width of the sensor, the surface of pixels, the numerical focusing, and the aberrations of the reference wave, as well as to an explicit formulation of the Shannon theorem for digital holography. Experimental illustrations confirm the proposed theoretical analysis.