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Daniele Ielmini

Researcher at Polytechnic University of Milan

Publications -  419
Citations -  20472

Daniele Ielmini is an academic researcher from Polytechnic University of Milan. The author has contributed to research in topics: Resistive random-access memory & Phase-change memory. The author has an hindex of 68, co-authored 367 publications receiving 16443 citations. Previous affiliations of Daniele Ielmini include Instituto Politécnico Nacional & Corecom.

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In-memory computing with resistive switching devices

TL;DR: This Review Article examines the development of in-memory computing using resistive switching devices, where the two-terminal structure of the devices, theirresistive switching properties, and direct data processing in the memory can enable area- and energy-efficient computation.
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Phase Change Materials and Their Application to Nonvolatile Memories

TL;DR: Phase change materials are materials that exist in at least two structurally distinct solid phases, an amorphous and one (or more) crystalline phases that can be used to store information in technological applications if it is possible to switch the material repeatedly between the two phases and if both phases are stable at operating temperature.
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Resistive switching memories based on metal oxides: mechanisms, reliability and scaling

TL;DR: This work provides an overview of the current understanding of bipolar-switching RRAM operation, reliability and scaling, and the stability of the low- and high-resistance states will be discussed in terms of conductance fluctuations and evolution in 1D filaments containing only a few atoms.
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Analytical model for subthreshold conduction and threshold switching in chalcogenide-based memory devices

TL;DR: In this article, a physically based model for conduction in amorphous chalcogenide material is provided, able to predict the currentvoltage (I−V) characteristics as a function of phase state, temperature, and cell geometry.
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Modeling the Universal Set/Reset Characteristics of Bipolar RRAM by Field- and Temperature-Driven Filament Growth

TL;DR: In this paper, a physically-based explanation for universal resistance switching in bipolar resistive switching memory (RRAM) devices is provided, where a numerical model of filament growth based on thermally activated ion migration accounts for the resistance switching characteristics.