David M. Broadway

Bio: David M. Broadway is an academic researcher from Marshall Space Flight Center. The author has contributed to research in topics: Sputter deposition & Thin film. The author has an hindex of 8, co-authored 26 publications receiving 210 citations.

Achieving zero stress in iridium, chromium, and nickel thin films

Abstract: We examine a method for achieving zero intrinsic stress in thin films of iridium, chromium, and nickel deposited by magnetron sputter deposition. The examination of the stress in these materials is motivated by efforts to advance the optical performance of light-weight x-ray space telescopes into the regime of sub-arc second resolution. A characteristic feature of the intrinsic stress behavior in chromium and nickel is their sensitivity to the magnitude and sign of the intrinsic stress with argon gas pressure, including the existence of a critical pressure that results in zero film stress. This critical pressure scales linearly with the film’s density. While the effect of stress reversal with argon pressure has been previously reported by Hoffman and others for nickel and chromium, we have discovered a similar behavior for the intrinsic stress in iridium films. Additionally, we have identified zero stress in iridium shortly after island coalescence in the high adatom mobility growth regime. This feature of film growth is used for achieving a total internal stress of -2.89 MPa for a 15.8 nm thick iridium film with a surface roughness of 5.0 ± 0.5A based on x-ray reflectivity (XRR) measurement at CuKα. The surface topography was also examined using atomic force microscopy (AFM). The examination of the stress in these films has been performed with a novel in-situ measurement device. The methodology and sensitivity of the in-situ instrument is also described herein.

Optical instrument design of the high-energy x-ray probe (HEX-P)

Abstract: The High-Energy X-ray Probe (HEX-P) is a probe-class next-generation high-energy X-ray mission concept that will vastly extend the reach of broadband X-ray observations. Studying the 2-200 keV energy range, HEXP has 40 times the sensitivity of any previous mission in the 10-80 keV band, and will be the first focusing instrument in the 80-200 keV band. A successor to the Nuclear Spectroscopic Telescope Array (NuSTAR), a NASA Small Explorer launched in 2012, HEX-P addresses key NASA science objectives, and will serve as an important complement to ESA’s L-class Athena mission. HEX-P will utilize multilayer coated X-ray optics, and in this paper we present the details of the optical design, and discuss the multilayer prescriptions necessary for the reflection of hard X-ray photons. We consider multiple module designs with the aim of investigating the tradeoff between high- and low-energy effective area, and review the technology development necessary to reach that goal within the next decade.

Development of grazing incidence multilayer mirrors for hard x-ray focusing telescopes

Abstract: We are developing depth-graded, multilayer-coated mirrors for astrophysical hard X-ray focusing telescopes. In this paper, we discuss the primary technical challenges associated with the multilayer coatings, and report on progress to date. We have sputtered constant cl-spacing and depth-graded W / Si multilayers onto 0.3- 0.5 mm thick DURAN glass (AF45 and D263) and 0.4 mm thick epoxy replicated aluminum foils (ERAFs) , both of which are potential mirror substrates. We have characterized the interfacial roughness, uniformity, and stress of the coatings. The average interfacial roughness of each multilayer was measured from specular reflectivity scans (Bi = Br) using Cu K0 X-rays. The thin film stress was calculated from the change in curvature induced by the coating on flat glass substrates. Thickness and roughness uniformity were measured by taking specular reflectivity scans of a multilayer deposited on the inside surface of a quarter cylinder section. We found that interfacial roughness (a) in the multilayers was typically between 3.5 and 4.0 A on DESAG glass, and between 4.5 and 5.0 A on the ERAFs. Also, we found that coatings deposited on glass that has been thermally formed into a cylindrical shape performed as well as flat glass. The film stress, calculated from Stoney's equation, for a 200 layer graded multilayer was approximately 200 MPa. Our uniformity measurements show that with no baffles to alter the deposition profile on a curved optic, the layer thickness differs by "'203 between the center and the edge of the optic. Interfacial roughness, however, remained constant, around 3.6 A, throughout the curved piece, even as the layer spacing dropped off.

Normal-incidence condenser mirror arrangement for compact water-window x-ray microscopy

Abstract: We demonstrate a water-window condenser arrangement for transmission x-ray microscopy based on table-top sources. A spherical normal-incidence multilayer mirror is used to focus and monochromatize water-window x-ray emission from a high-brightness droplet-target laser-plasma source. The condenser arrangement is compact, has high collection efficiency, and is easy to align. The maximum normal- incidence reflectivity at the desired wavelength, (lambda) equals 3.37 nm, was determined to be up to 3 percent. The potential for compact water-window transmission x-ray microscopy using the condenser arrangement is discussed.© (1999) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Status of small d-spacing x-ray multilayers development at Osmic

Abstract: The deposition and X-ray performance of multilayer structures with d-spacings ranging from 1.2nm to 3.5nm has been presented. Different pairs of materials such as W (Mo, Ni, Cr, and La)/B4C, Ni (Cr, Co, V)/C have been considered. X-ray reflectivity of the multilayers has been measured in the photon energy range from ~0.18keV to ~100keV. W/B4C structures with d~1.5nm showed reflectivity greater than 30% at Cu-Kα (E~8keV). Performance of a W/B4C structure with d~1.5nm has been compared with TIAP crystal performance in analysis of Si-Kα (1.74keV), Al-Kα (1.5keV), Mg-Kα (1.25keV) and Na-Kα (1.04keV) radiation. Results showed that small d-spacing multilayers can be considered for TIAP crystal replacement in Wavelength Dispersive X-Ray Fluorescence (WDXRF) spectrometers. The absolute reflectivity of near normal incidence structures at O-Kα (~293eV), C-Kα (~277eV) and B-Kα (~183eV) radiation lines has been measured to be ~1.5%, 14% and 43% respectively with spectral resolution of up to ~0.6%.

Compact water-window transmission X-ray microscopy.

Abstract: We demonstrate sub-100 nm resolution water-window soft X-ray full-field transmission microscopy with a compact system. The microscope operates at lambda = 3.37 nm and is based on a 100 Hz table-top regenerative debris-free droplet-target laser-plasma X-ray source in combination with normal-incidence multilayer condenser optics for sample illumination. High-spatial-resolution imaging is performed with a 7.3% efficiency nickel zone plate and a 1024 x 1024 pixel CCD detector. Images of dry test samples are recorded with exposure times of a few minutes and show features smaller than 60 nm.

XMM-Newton observatory*: I. The spacecraft and operations. Commentary

Abstract: The XMM-Newton Observatory is a cornerstone mission of the European Space Agency's Horizon 2000 programme, and is the largest scientific satellite it has launched to date. This paper summarises the principal characteristics of the Observatory which are pertinent to scientific operations. The scientific results appearing in this issue have been enabled by the unprecedentedly large effective area of the three mirror modules, which are briefly described. The in-orbit performance and preliminary calibrations of the observatory are briefly summarised. The observations from the XMM-Newton calibration and performance verification phase, which are public and from which most papers in this issue have been derived, are listed. The flow of data from the spacecraft, through the ground segment, to the production of preliminary science products supplied to users is also discussed.

Lynx X-Ray Observatory: an overview

Abstract: Lynx, one of the four strategic mission concepts under study for the 2020 Astrophysics Decadal Survey, provides leaps in capability over previous and planned x-ray missions and provides synergistic observations in the 2030s to a multitude of space- and ground-based observatories across all wavelengths. Lynx provides orders of magnitude improvement in sensitivity, on-axis subarcsecond imaging with arcsecond angular resolution over a large field of view, and high-resolution spectroscopy for point-like and extended sources in the 0.2- to 10-keV range. The Lynx architecture enables a broad range of unique and compelling science to be carried out mainly through a General Observer Program. This program is envisioned to include detecting the very first seed black holes, revealing the high-energy drivers of galaxy formation and evolution, and characterizing the mechanisms that govern stellar evolution and stellar ecosystems. The Lynx optics and science instruments are carefully designed to optimize the science capability and, when combined, form an exciting architecture that utilizes relatively mature technologies for a cost that is compatible with the projected NASA Astrophysics budget.

Growth, structure, and performance of depth-graded W/Si multilayers for hard x-ray optics

Abstract: We describe the development of depth-graded W/Si multilayer films prepared by magnetron sputtering for use as broad-band reflective coatings for hard x-ray optics. We have used specular and nonspecular x-ray reflectance analysis to characterize the interface imperfections in both periodic and depth-graded W/Si multilayer structures, and high-resolution transmission electron microscopy (TEM) and selected area electron diffraction (SAED) to characterize the interface structure and layer morphology as a function of depth in an optimized depth-graded multilayer. From x-ray analysis we find interface widths in the range σ=0.275–0.35 nm for films deposited at low argon pressure (with a slight increase in interface width for multilayers having periods greater than ∼20 nm, possibly due to the transition from amorphous to polycrystalline metal layers identified by TEM and SAED), and somewhat larger interface widths (i.e., σ=0.35–0.4 nm) for structures grown at higher Ar pressures, higher background pressures, or w...

The X-Ray Surveyor Mission: A Concept Study

Abstract: NASA's Chandra X-ray Observatory continues to provide an unparalleled means for exploring the high-energy universe. With its half-arcsecond angular resolution, Chandra studies have deepened our understanding of galaxy clusters, active galactic nuclei, galaxies, supernova remnants, neutron stars, black holes, and solar system objects. As we look beyond Chandra, it is clear that comparable or even better angular resolution with greatly increased photon throughput is essential to address ever more demanding science questions—such as the formation and growth of black hole seeds at very high redshifts; the emergence of the first galaxy groups; and details of feedback over a large range of scales from galaxies to galaxy clusters. Recently, we initiated a concept study for such a mission, dubbed X-ray Surveyor. The X-ray Surveyor strawman payload is comprised of a high-resolution mirror assembly and an instrument set, which may include an X-ray microcalorimeter, a high-definition imager, and a dispersive grating spectrometer and its readout. The mirror assembly will consist of highly nested, thin, grazing-incidence mirrors, for which a number of technical approaches are currently under development—including adjustable X-ray optics, differential deposition, and new polishing techniques applied to a variety of substrates. This study benefits from previous studies of large missions carried out over the past two decades and, in most areas, points to mission requirements no more stringent than those of Chandra.