Author
E. J. Mittemeijer
Other affiliations: Max Planck Society
Bio: E. J. Mittemeijer is an academic researcher from University of Stuttgart. The author has contributed to research in topics: Nitriding & Microstructure. The author has an hindex of 43, co-authored 238 publications receiving 7891 citations. Previous affiliations of E. J. Mittemeijer include Max Planck Society.
Papers published on a yearly basis
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TL;DR: The use of the Voigt function for the analysis of the integral breadths of broadened X-ray diffraction line profiles forms the basis of a rapid and powerful single-line method of crystallite size and strain determination which is easy to apply.
Abstract: The use of the Voigt function for the analysis of the integral breadths of broadened X-ray diffraction line profiles forms the basis of a rapid and powerful single-line method of crystallite-size and strain determination which is easy to apply. To avoid graphical methods or interpolation from tables, empirical formulae of high accuracy are used and an estimation of errors is presented, including the influence of line-profile asymmetry. The method is applied to four practical cases of size-strain broadening: (i) cold-worked nickel, (ii) a nitrided steel, (iii) an electrodeposited nickel layer and (iv) a liquid-quenched AlSi alloy.
1,085 citations
TL;DR: The components of the macroscopic mechanical stress tensor of a stressed thin film, coating, multilayer or the region near the surface of a bulk material can in principle be determined by X-ray diffraction as discussed by the authors.
Abstract: The components of the macroscopic mechanical stress tensor of a stressed thin film, coating, multilayer or the region near the surface of a bulk material can in principle be determined by X-ray diffraction. The various analysis methods and measurement strategies, in dependence on specimen and measurement conditions, are summarized and evaluated in this paper. First, different X-ray diffraction geometries (conventional or grazing incidence) are described. Then, the case of macroscopically elastically isotropic, untextured specimens is considered: from the simplest case of a uniaxial state of stress to the most complicated case of a triaxial state of stress. The treatment is organized according to the number of unknowns to be determined (i.e. the state of stress, principal axes known or unknown), the use of one or several values of the rotation angle φ and the tilt angle ψ of the sample, and one or multiple hkl reflections. Next, the focus is on macroscopically elastically anisotropic (e.g. textured) specimens. In this case, the use of diffraction (X-ray) elastic constants is not possible. Instead, diffraction (X-ray) stress factors have to be used. On the basis of examples, it is demonstrated that successful diffraction stress analysis is only possible if an appropriate grain-interaction model is applied.
529 citations
TL;DR: In this paper, the solubility of C in solid Cu was determined in the temperature range 1143-1293 K. Layers of C were vapour deposited onto high-purity Cu slices, which were annealed for 72 and 240 h at different temperatures.
293 citations
TL;DR: In this paper, it is shown that the current status of the least-squares profile-refinement method, for the determination of crystal structures from X-ray and neutron powder diagrams, allows the simultaneous determination of crystallite-size and lattice-strain parameters.
Abstract: It is shown that the current status of the least-squares profile-refinement method, for the determination of crystal structures from X-ray and neutron powder diagrams, allows the simultaneous determination of crystallite-size and lattice-strain parameters. As profile-shape functions the Voigt, pseudo-Voigt and Pearson VII functions are considered. Formulae are obtained enabling structure refinement and size-strain analysis in the same computer run.
273 citations
TL;DR: The structure and morphology of thin aluminium-oxide films grown by the dry, thermal oxidation of a bare Al (431) substrate at a partial oxygen pressure of 1.33 =10 Pa in the temperature range of 373-773 K were studied using X-ray photoelectron y4 spectroscopy and high resolution electron microscopy.
245 citations
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TL;DR: It is shown that graphene grows in a self-limiting way on copper films as large-area sheets (one square centimeter) from methane through a chemical vapor deposition process, and graphene film transfer processes to arbitrary substrates showed electron mobilities as high as 4050 square centimeters per volt per second at room temperature.
Abstract: Graphene has been attracting great interest because of its distinctive band structure and physical properties. Today, graphene is limited to small sizes because it is produced mostly by exfoliating graphite. We grew large-area graphene films of the order of centimeters on copper substrates by chemical vapor deposition using methane. The films are predominantly single-layer graphene, with a small percentage (less than 5%) of the area having few layers, and are continuous across copper surface steps and grain boundaries. The low solubility of carbon in copper appears to help make this growth process self-limiting. We also developed graphene film transfer processes to arbitrary substrates, and dual-gated field-effect transistors fabricated on silicon/silicon dioxide substrates showed electron mobilities as high as 4050 square centimeters per volt per second at room temperature.
10,663 citations
TL;DR: In this article, the authors present methods of severe plastic deformation and formation of nanostructures, including Torsion straining under high pressure, ECA pressing, and multiple forging.
5,763 citations
University of Cambridge1, Istituto Italiano di Tecnologia2, Lancaster University3, University of Manchester4, Catalan Institution for Research and Advanced Studies5, Technical University of Denmark6, Nokia7, Queen Mary University of London8, University of Trento9, fondazione bruno kessler10, Technische Universität München11, Polytechnic University of Milan12, Centre national de la recherche scientifique13, University of Trieste14, University of Ioannina15, University of Geneva16, Trinity College, Dublin17, Texas Instruments18, University of Paris19, Spanish National Research Council20, Leiden University21, Delft University of Technology22, University of Patras23, École Normale Supérieure24, Radboud University Nijmegen25, Nest Labs26, Airbus UK27, Seoul National University28, Yonsei University29, University of Oxford30, Chalmers University of Technology31, University of Groningen32, STMicroelectronics33, Chemnitz University of Technology34, Max Planck Society35, Aalto University36
TL;DR: An overview of the key aspects of graphene and related materials, ranging from fundamental research challenges to a variety of applications in a large number of sectors, highlighting the steps necessary to take GRMs from a state of raw potential to a point where they might revolutionize multiple industries are provided.
Abstract: We present the science and technology roadmap for graphene, related two-dimensional crystals, and hybrid systems, targeting an evolution in technology, that might lead to impacts and benefits reaching into most areas of society. This roadmap was developed within the framework of the European Graphene Flagship and outlines the main targets and research areas as best understood at the start of this ambitious project. We provide an overview of the key aspects of graphene and related materials (GRMs), ranging from fundamental research challenges to a variety of applications in a large number of sectors, highlighting the steps necessary to take GRMs from a state of raw potential to a point where they might revolutionize multiple industries. We also define an extensive list of acronyms in an effort to standardize the nomenclature in this emerging field.
2,560 citations