E. Joy

Bio: E. Joy is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Radiation pattern & Antenna measurement. The author has an hindex of 7, co-authored 7 publications receiving 600 citations.

Basic theory of probe-compensated near-field measurements

Abstract: The general problem concerning the interaction of a probe antenna with the near field of an arbitrary antenna is considered. The application of the Lorentz reciprocity theorem to the problem of determining antenna characteristics, including the far-field pattern, is presented. The data required to correct for the directional effects of the probe, the effect of probe correction on the measured data, and the attendant mathematical computations in rectangular systems are described. Extensions to cylindrical and spherical systems are discussed.

Spatial sampling and filtering in near-field measurements

Abstract: A sample spacing criterion and a data minimization technique for measurements made over the surface of a plane in the near field of an antenna are presented. The sample spacing is shown to depend on the distance from the antenna to the measurement plane, and on the extent to which evanescent waves can be neglected. The near-field data minimization technique utilizes two-dimensional spatial filtering to effect a significant reduction in computational effort required to calculate selected portions of the far-field pattern. Far-field patterns of an X band antenna calculated from near-field measurements are presented and compared with those measured on a standard far-field range. The far-field calculations are repeated for several near-field sample spacings and for various post-filter sample rates.

Applications of probe-compensated near-field measurements

Abstract: The theory of near-field measurements for antenna practitioners is summarized, and the measurement procedures in three coordinate systems, namely rectangular, cylindrical, and spherical are outlined. Specific topics include probe characterization, measurement systems, data reduction, and attendant accuracies. The results of recent studies are also summarized, and some brief remarks on future applications of near-field measurements in the laboratory, the production line, and in field testing and evaluation conclude the paper.

Test zone field compensation

Abstract: Test zone field (TZF) compensation increases antenna pattern measurement accuracy by compensating for extraneous fields created by reflection and scattering of the range antenna field from fixed objects in the range and by leakage of the range RF system from a fixed location in the range. TZF compensation can be used on fixed line-of-sight (static) far-field, compact, and near-field ranges. Other compensation techniques are seldom used in practical measurement situations because they are limited in the amount of compensation they provide. These techniques do not adequately model the type of extraneous field present in the range or require increased measurement time and equipment necessary to implement the technique. TZF compensation overcomes these limits as follows. The TZF is measured over a spherical surface encompassing the test zone using a low gain probe. The measured TZF is used antenna pattern measurements to compensate for extraneous fields. TZF compensation theory is presented and demonstrated using measured data. >

Near-field qualification methodology

Abstract: A methodology that is a combination of analysis, computer simulation, component certification, self-tests, and comparison tests is presented for the accuracy qualification of near-field antenna measurement ranges. The analysis uses closed-form equations to establish upper-bound far-field determination errors due to near-field measurement errors. Computer simulation is used to model the specific near-field measurement errors associated with the near-field measurement system components. The closed-form equations and computer simulations are used to form a near-field error budget for each of the near-field measurement system components. A near-field system component certification is undertaken to measure the near-field measurement system component error and establish that they are within the error budget. >

An overview of near-field antenna measurements

Abstract: After a brief history of near-field antenna measurements with and without probe correction, the theory of near-field antenna measurements is outlined beginning with ideal probes scanning on arbitrary surfaces and ending with arbitrary probes scanning on planar, cylindrical, and spherical surfaces. Probe correction is introduced for all three measurement geometries as a slight modification to the ideal probe expressions. Sampling theorems are applied to determine the required data-point spacing, and efficient computational methods along with their computer run times are discussed. The major sources of experimental error defining the accuracy of typical planar near-field measurement facilities are reviewed, and present limitations of planar, cylindrical, and spherical near-field scanning are identified.

An Overview of Near Field UHF RFID

Abstract: In this paper, an overview of near field UHF RFID is presented. This technology recently received attention because of its possible use for item-level tagging where LF/HF RFID has traditionally been used. We review the relevant literature, discuss basic theory of near and far field antenna coupling in application to RFID, and present some experimental measurements.

Error analysis techniques for planar near-field measurements

Abstract: A combination of techniques is described for reliably estimating the magnitude of each error arising in planar near-field measurements. They include mathematical analysis, computer simulation, and measurement tests. There are three primary applications for these tests: in designing a measurement facility, the requirements of each part of the measurement system can be specified to meet a given level of accuracy; during actual measurements, the experimenter can identify, and reduce where necessary, potential sources of error in the measurement; and when a measurement has been completed, the estimated uncertainty in the measurement can be obtained with confidence and ease. The latter application has been used in many measurements to verify that the planar near-field technique produces high-accuracy results competitive with any other measurement technique. >

Basic theory of probe-compensated near-field measurements

Abstract: The general problem concerning the interaction of a probe antenna with the near field of an arbitrary antenna is considered. The application of the Lorentz reciprocity theorem to the problem of determining antenna characteristics, including the far-field pattern, is presented. The data required to correct for the directional effects of the probe, the effect of probe correction on the measured data, and the attendant mathematical computations in rectangular systems are described. Extensions to cylindrical and spherical systems are discussed.

Planar near-field to far-field transformation using an equivalent magnetic current approach

Abstract: An alternative method is presented for computing far-field antenna patterns from near-field measurements. The method utilizes the near-field data to determine equivalent magnetic current sources over a fictitious planar surface that encompasses the antenna, and these currents are used to ascertain the far fields. Under certain approximations, the currents should produce the correct far fields in all regions in front of the antenna regardless of the geometry over which the near-field measurements are made. An electric field integral equation (EFIE) is developed to relate the near fields to the equivalent magnetic currents. The method of moments is used to transform the integral equation into a matrix one. The matrix equation is solved with the conjugate gradient method, and in the case of a rectangular matrix, a least-squares solution for the currents is found without explicitly computing the normal form of the equation. Near-field to far-field transformation for planar scanning may be efficiently performed under certain conditions. Numerical results are presented for several antenna configurations. >