E. Wysocki

Bio: E. Wysocki is an academic researcher from Johns Hopkins University. The author has contributed to research in topics: System identification & Harmonic balance. The author has an hindex of 1, co-authored 1 publications receiving 30 citations.

Further results on the identification problem for the class of nonlinear systems S_M

Abstract: For the class of nonlinear systems S_{M} , the structure of the identification problem based on steady-state frequency response is considered. Two approaches using amplitude and phase measurements are presented, one of which requires measurements of only the first two harmonics of the steady-state response. Furthermore it is shown that with a minimum phase restriction the system can be identified from amplitude measurements of the first two harmonics. In each case we obtain a considerable reduction in the number of measurements and inputs required by previous approaches.

Identification of Nonlinear Systems- A Survey

Abstract: A survey of nonlinear system identification algorithms and related topics is presented by extracting significant results from the literature and presenting these in an organised and systematic way. Algorithms based on the functional expansions of Wiener and Volterra, the identification of block-oriented and bilinear systems, the selection of input signals, structure detection, parameter estimation and recent results from catastrophe theory and included. The limitations, relationships and applicability of the methods are discussed throughout.

Automatic test generation techniques for analog circuits and systems: A review

Abstract: The purpose of this paper is both a review and an assessment of techniques presently available for automatic test generation for analog systems. After recalling the general problems of automatic testing (definitions, faults in analog systems, different types of tests, main operations, and diagnosis procedures), characterization and description modes of analog systems, and the main software ingredients of automatic test equipment, a categorization of known techniques along several criteria can be proposed. Then, several techniques, respectively, proceeding from approaches based on deterministic and probabilistic estimation, taxonomical and topological analyses can be detailed. Techniques specific to linear systems (several of them belonging to the above three categories) are dealt with in a separate section. The main features of the techniques that are described are summed up in five synoptic tables. As a conclusion, several research areas that need further investigation in view of a possible industrial implementation of automatic analog test generation techniques are identified. Two appendixes deal briefly with fault tolerance and fault simulation in analog systems. An extensive bibliography ( \sim 500 entries) is provided.

Identification of Linear Systems with Nonlinear Distortions

Abstract: This paper studies the impact of nonlinear distortions on linear system identification. It collects a number of previously published methods in a fully integrated approach to measure and model these systems from experimental data. First a theoretical framework is proposed that extends the linear system description to include the impact of nonlinear distortions: the nonlinear system is replaced by a linear model plus a 'nonlinear noise source'. The class of nonlinear systems covered by this approach is described and the properties of the extended linear representation are studied. These results are used to design the experiments; to detect the level of the nonlinear distortions; to measure efficiently the 'best' linear approximation; to reveal the even or odd nature of the nonlinearity; to identify a parametric linear model; and to improve the model selection procedures in the presence of nonlinear distortions.