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Edmund Y. Lam

Researcher at University of Hong Kong

Publications -  425
Citations -  7925

Edmund Y. Lam is an academic researcher from University of Hong Kong. The author has contributed to research in topics: Iterative reconstruction & Computer science. The author has an hindex of 41, co-authored 382 publications receiving 6762 citations. Previous affiliations of Edmund Y. Lam include Hong Kong Applied Science and Technology Research Institute & The Chinese University of Hong Kong.

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Journal ArticleDOI

A mathematical analysis of the DCT coefficient distributions for images

TL;DR: This work offers a rigorous mathematical analysis using a doubly stochastic model of the images, which not only provides the theoretical explanations necessary, but also leads to insights about various other observations from the literature.
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A Total Variation Regularization Based Super-Resolution Reconstruction Algorithm for Digital Video

TL;DR: This paper uses the fixed-point iteration method and preconditioning techniques to efficiently solve the associated nonlinear Euler-Lagrange equations of the corresponding variational problem in SR.
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Learning-based nonparametric autofocusing for digital holography

TL;DR: distance estimation is converted to hologram prediction, which is solved by designing a powerful convolutional neural network trained by a set of holograms acquired a priori, which allows fast autofocusing without reconstructing an image stack, even when the physical parameters of the optical setup are unknown.
Proceedings ArticleDOI

Source camera identification using footprints from lens aberration

TL;DR: Inspired by the previous work that uses sensor imperfection, the intrinsic lens aberration is proposed to use as features in the classification of images captured by a limited number of camera models.
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Standard cell layout with regular contact placement

TL;DR: In this paper, the practicability and methodology of applying regularly placed contacts on layout design of standard cells are studied. And the regular placement enables more effective use of resolution enhancement technologies, which in turn allows for a reduction of critical dimensions.