Enrico Savio

Bio: Enrico Savio is an academic researcher from University of Padua. The author has contributed to research in topics: Coordinate-measuring machine & Scanning probe microscopy. The author has an hindex of 24, co-authored 92 publications receiving 1785 citations. Previous affiliations of Enrico Savio include University of Brescia.

Combination of a Vision System and a Coordinate Measuring Machine for the Reverse Engineering of Freeform Surfaces

Abstract: This paper describes a novel methodology for the reverse engineering of complex, free form surfaces, based on the integration of the measurement information from a 3D vision sensor and a coordinate measuring machine (CMM). The aim is to reconstruct the CAD model of objects of complex geometry with high accuracy and at the same time rapidly exploiting the advantages deriving from the use of both the optical and the mechanical sensors, with a minimum of human intervention. The combination is performed at the level of measurement information, within a module for the intelligent aggregation of the information from optical and mechanical sensors. Tools are developed for digitising, filtering, grouping and surface-fitting the 3D images of the vision sensor and the point clouds from digitisation of the CMM. In the paper, the combined system is described, and two industrial applications are presented.

Critical factors in SEM 3D stereo microscopy

Abstract: This work addresses dimensional measurements performed with the scanning electron microscope (SEM) using 3D reconstruction of surface topography through stereo-photogrammetry. The paper presents both theoretical and experimental investigations, on the effects of instrumental variables and measurement parameters on reconstruction accuracy. Investigations were performed on a novel sample, specifically developed and implemented for the tests. The description is based on the model function introduced by Piazzesi and adapted for eucentrically tilted stereopairs. Two main classes of influencing factors are recognized: the first one is related to the measurement operation and the instrument set-up; the second concerns the quality of scanned images and represents the major criticality in the application of SEMs for 3D characterizations.

Computed tomography for dimensional metrology

Abstract: The paper gives a survey of the upcoming use of X-ray computed tomography (CT) for dimensional quality control purposes: i.e. for traceable measurement of dimensions of technical (mechanical) components and for tolerance verification of such components. It describes the basic principles of CT metrology, putting emphasis on issues as accuracy, traceability to the unit of length (the meter) and measurement uncertainty. It provides a state of the art (anno 2011) and application examples, showing the aptitude of CT metrology to: (i) check internal dimensions that cannot be measured using traditional coordinate measuring machines and (ii) combine dimensional quality control with material quality control in one single quality inspection run.

State-of-The-Art and Applications of 3D Imaging Sensors in Industry, Cultural Heritage, Medicine, and Criminal Investigation

Abstract: 3D imaging sensors for the acquisition of three dimensional (3D) shapes have created, in recent years, a considerable degree of interest for a number of applications. The miniaturization and integration of the optical and electronic components used to build them have played a crucial role in the achievement of compactness, robustness and flexibility of the sensors. Today, several 3D sensors are available on the market, even in combination with other sensors in a “sensor fusion” approach. An importance equal to that of physical miniaturization has the portability of the measurements, via suitable interfaces, into software environments designed for their elaboration, e.g., CAD-CAM systems, virtual renders, and rapid prototyping tools. In this paper, following an overview of the state-of-art of 3D imaging sensors, a number of significant examples of their use are presented, with particular reference to industry, heritage, medicine, and criminal investigation applications.

Industrial applications of computed tomography

Abstract: The number of industrial applications of Computed Tomography (CT) is large and rapidly increasing. After a brief market overview, the paper gives a survey of state of the art and upcoming CT technologies, covering types of CT systems, scanning capabilities, and technological advances. The paper contains a survey of application examples from the manufacturing industry as well as from other industries, e.g., electrical and electronic devices, inhomogeneous materials, and from the food industry. Challenges as well as major national and international coordinated activities in the field of industrial CT are also presented.

Invited review article: high-speed flexure-guided nanopositioning: mechanical design and control issues.

Abstract: Recent interest in high-speed scanning probe microscopy for high-throughput applications including video-rate atomic force microscopy and probe-based nanofabrication has sparked attention on the development of high-bandwidth flexure-guided nanopositioning systems (nanopositioners). Such nanopositioners are designed to move samples with sub-nanometer resolution with positioning bandwidth in the kilohertz range. State-of-the-art designs incorporate uniquely designed flexure mechanisms driven by compact and stiff piezoelectric actuators. This paper surveys key advances in mechanical design and control of dynamic effects and nonlinearities, in the context of high-speed nanopositioning. Future challenges and research topics are also discussed.