E
Erik H. Anderson
Researcher at Lawrence Berkeley National Laboratory
Publications - 303
Citations - 13630
Erik H. Anderson is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Extreme ultraviolet lithography & Microscope. The author has an hindex of 48, co-authored 299 publications receiving 12951 citations. Previous affiliations of Erik H. Anderson include Grove City College & Colorado State University.
Papers
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Journal ArticleDOI
FinFET-a self-aligned double-gate MOSFET scalable to 20 nm
Digh Hisamoto,Wen-Chin Lee,J. Kedzierski,Hideki Takeuchi,K. Asano,C. Kuo,Erik H. Anderson,Tsu-Jae King,Jeffrey Bokor,Chenming Hu +9 more
TL;DR: In this paper, a self-aligned double-gate MOSFET, FinFET was proposed by using boron-doped Si/sub 04/Ge/sub 06/ as a gate material.
Journal ArticleDOI
Nanomechanical oscillations in a single-C60 transistor
Hongkun Park,Hongkun Park,Jiwoong Park,Andrew K. L. Lim,Erik H. Anderson,A. Paul Alivisatos,Paul L. McEuen,Paul L. McEuen +7 more
TL;DR: Transport measurements are performed that provide evidence for a coupling between the centre-of-mass motion of the C60 molecules and single-electron hopping—a conduction mechanism that has not been observed previously in quantum dot studies.
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Soft X-ray microscopy at a spatial resolution better than 15 nm
Weilun Chao,Weilun Chao,Bruce Harteneck,J. Alexander Liddle,Erik H. Anderson,David Attwood,David Attwood +6 more
TL;DR: The achievement of sub-15-nm spatial resolution with a soft X-ray microscope—and a clear path to below 10 nm—using an overlay technique for zone plate fabrication is reported.
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Interferometer‐controlled scanning transmission X‐ray microscopes at the Advanced Light Source
A. L. D. Kilcoyne,Tolek Tyliszczak,Tolek Tyliszczak,W. F. Steele,Sirine C. Fakra,P. Hitchcock,P. Hitchcock,K. Franck,Erik H. Anderson,Bruce Harteneck,Ed G. Rightor,G. E. Mitchell,Adam P. Hitchcock,L. Yang,Tony Warwick,Harald Ade +15 more
TL;DR: Two new soft X-ray scanning transmission microscopes located at the Advanced Light Source (ALS) have been designed, built and commissioned and interferometer control implemented in both microscopes allows the precise measurement of the transverse position of the zone plate relative to the sample.
Journal ArticleDOI
Scanned probe microscopy of electronic transport in carbon nanotubes.
Adrian Bachtold,Adrian Bachtold,Michael S. Fuhrer,Michael S. Fuhrer,Sergei Plyasunov,Sergei Plyasunov,M. Forero,M. Forero,Erik H. Anderson,Alex Zettl,Alex Zettl,Paul L. McEuen,Paul L. McEuen +12 more
TL;DR: Electrostatic force microscopy and scanned gate microscopy are used to probe the conducting properties of carbon nanotubes at room temperature and demonstrate diffusive and ballistic conductors over micron lengths.