Eva Monroy

Bio: Eva Monroy is an academic researcher from University of Grenoble. The author has contributed to research in topics: Quantum dot & Quantum well. The author has an hindex of 52, co-authored 425 publications receiving 10761 citations. Previous affiliations of Eva Monroy include Technische Universität München & Joseph Fourier University.

Wide-bandgap semiconductor ultraviolet photodetectors

Abstract: Industries such as the automotive, aerospace or military, as well as environmental and biological research have promoted the development of ultraviolet (UV) photodetectors capable of operating at high temperatures and in hostile environments. UV-enhanced Si photodiodes are hence giving way to a new generation of UV detectors fabricated from wide-bandgap semiconductors, such as SiC, diamond, III-nitrides, ZnS, ZnO, or ZnSe. This paper provides a general review of latest progresses in wide-bandgap semiconductor photodetectors.

Systematic experimental and theoretical investigation of intersubband absorption in Ga N ∕ Al N quantum wells

Abstract: We have studied the electronic confinement in hexagonal (0001) $\mathrm{Ga}\mathrm{N}∕\mathrm{Al}\mathrm{N}$ multiple quantum wells by means of structural (high-resolution x-ray diffraction and transmission electron microscopy) as well as optical characterizations, namely intersubband absorption and interband photoluminescence spectroscopies. Intense intersubband absorptions covering the $1.33--1.91\phantom{\rule{0.3em}{0ex}}\ensuremath{\mu}\mathrm{m}$ wavelength range have been measured on a series of samples with well thicknesses varying from $1\phantom{\rule{0.3em}{0ex}}\text{to}\phantom{\rule{0.3em}{0ex}}2.5\phantom{\rule{0.3em}{0ex}}\mathrm{nm}$. The absorption line shape exhibits either a pure Lorentzian shape or multiple peaks. In the first case the broadening is homogeneous with a state-of-the-art low value of $67\phantom{\rule{0.3em}{0ex}}\mathrm{meV}$. We deduce a dephasing time of the electrons in the excited subband ${T}_{2}$ of about $20\phantom{\rule{0.3em}{0ex}}\mathrm{fs}$. For structured spectra the absorption can be perfectly reproduced with a sum of several Lorentzian curves; the individual peaks originate from absorption in quantum well regions with thickness equal to an integer number of monolayers. We have also carried out simulations of the electronic structure which point out the relevance of the nonparabolicity and many-body corrections on the intersubband absorption energy. The intersubband absorption exhibits a blue shift with doping as a result of many-body effects dominated by the exchange interaction. An excellent agreement with the experimental data is demonstrated. The best fit is achieved using a conduction band offset at the $\mathrm{Ga}\mathrm{N}∕\mathrm{Al}\mathrm{N}$ heterointerfaces of $1.7\ifmmode\pm\else\textpm\fi{}0.05\phantom{\rule{0.3em}{0ex}}\mathrm{eV}$ and a polarization discontinuity $\ensuremath{\Delta}P∕({ϵ}_{0}{ϵ}_{r})$ of $10\ifmmode\pm\else\textpm\fi{}1\phantom{\rule{0.3em}{0ex}}\mathrm{M}\mathrm{V}∕\mathrm{cm}$.

III nitrides and UV detection

Abstract: III nitrides have become the most exciting challenge in optoelectronic materials in the last decade. Their intrinsic properties and an intense technological effort have made possible the fabrication of reliable and versatile detectors for short wavelengths. In this work, materials and devices issues are considered to provide a full picture of the advances in nitride UV photodetection. First, basic structures like photoconductors, Schottky, p-i-n and metal-semiconductor-metal photodiodes and phototransistors are compared, with emphasis on their specific properties and performance limitations. The efforts in the design and fabrication of more advanced detectors, in the search for higher quantum efficiency, contrast, signal-to-noise or speed operation, are reviewed afterwards. Metal-insulator-semiconductor diodes, avalanche photodetectors and GaN array detectors for UV imaging are also described. Further device optimization is linked with present materials issues, mainly due to the nitride quality, which is a direct result of the substrate used. The influence of substrates and dislocations on detector behaviour is discussed in detail. As an example of AlGaN photodetector applications, monitoring of the solar UV-B radiation to prevent erythema and skin cancer is presented.

GaN/AlN short-period superlattices for intersubband optoelectronics: A systematic study of their epitaxial growth, design, and performance

Abstract: We have studied the effect of growth and design parameters on the performance of Si-doped GaN/AlN multiquantum-well (MQW) structures for intersubband optoelectronics in the near infrared. The samples under study display infrared absorption in the 1.3–1.9 μm wavelength range, originating from the photoexcitation of electrons from the first to the second electronic level in the QWs. A commonly observed feature is the presence of multiple peaks in both intersubband absorption and interband emission spectra, which are attributed to monolayer thickness fluctuations in the quantum wells. These thickness fluctuations are induced by dislocations and eventually by cracks or metal accumulation during growth. The best optical performance is attained in samples synthesized with a moderate Ga excess during the growth of both the GaN QWs and the AlN barriers without growth interruptions. The optical properties are degraded at high growth temperatures (>720 °C) due to the thermal activation of the AlN etching of GaN. Fr...

Fast parallel algorithms for short-range molecular dynamics

Abstract: Three parallel algorithms for classical molecular dynamics are presented. The first assigns each processor a fixed subset of atoms; the second assigns each a fixed subset of inter-atomic forces to compute; the third assigns each a fixed spatial region. The algorithms are suitable for molecular dynamics models which can be difficult to parallelize efficiently—those with short-range forces where the neighbors of each atom change rapidly. They can be implemented on any distributed-memory parallel machine which allows for message-passing of data between independently executing processors. The algorithms are tested on a standard Lennard-Jones benchmark problem for system sizes ranging from 500 to 100,000,000 atoms on several parallel supercomputers--the nCUBE 2, Intel iPSC/860 and Paragon, and Cray T3D. Comparing the results to the fastest reported vectorized Cray Y-MP and C90 algorithm shows that the current generation of parallel machines is competitive with conventional vector supercomputers even for small problems. For large problems, the spatial algorithm achieves parallel efficiencies of 90% and a 1840-node Intel Paragon performs up to 165 faster than a single Cray C9O processor. Trade-offs between the three algorithms and guidelines for adapting them to more complex molecular dynamics simulations are also discussed.

Band parameters for nitrogen-containing semiconductors

Abstract: We present a comprehensive and up-to-date compilation of band parameters for all of the nitrogen-containing III–V semiconductors that have been investigated to date. The two main classes are: (1) “conventional” nitrides (wurtzite and zinc-blende GaN, InN, and AlN, along with their alloys) and (2) “dilute” nitrides (zinc-blende ternaries and quaternaries in which a relatively small fraction of N is added to a host III–V material, e.g., GaAsN and GaInAsN). As in our more general review of III–V semiconductor band parameters [I. Vurgaftman et al., J. Appl. Phys. 89, 5815 (2001)], complete and consistent parameter sets are recommended on the basis of a thorough and critical review of the existing literature. We tabulate the direct and indirect energy gaps, spin-orbit and crystal-field splittings, alloy bowing parameters, electron and hole effective masses, deformation potentials, elastic constants, piezoelectric and spontaneous polarization coefficients, as well as heterostructure band offsets. Temperature an...

Luminescence properties of defects in GaN

Abstract: Gallium nitride (GaN) and its allied binaries InN and AIN as well as their ternary compounds have gained an unprecedented attention due to their wide-ranging applications encompassing green, blue, violet, and ultraviolet (UV) emitters and detectors (in photon ranges inaccessible by other semiconductors) and high-power amplifiers. However, even the best of the three binaries, GaN, contains many structural and point defects caused to a large extent by lattice and stacking mismatch with substrates. These defects notably affect the electrical and optical properties of the host material and can seriously degrade the performance and reliability of devices made based on these nitride semiconductors. Even though GaN broke the long-standing paradigm that high density of dislocations precludes acceptable device performance, point defects have taken the center stage as they exacerbate efforts to increase the efficiency of emitters, increase laser operation lifetime, and lead to anomalies in electronic devices. The p...

Gan : processing, defects, and devices

Abstract: The role of extended and point defects, and key impurities such as C, O, and H, on the electrical and optical properties of GaN is reviewed. Recent progress in the development of high reliability contacts, thermal processing, dry and wet etching techniques, implantation doping and isolation, and gate insulator technology is detailed. Finally, the performance of GaN-based electronic and photonic devices such as field effect transistors, UV detectors, laser diodes, and light-emitting diodes is covered, along with the influence of process-induced or grown-in defects and impurities on the device physics.

Increase in the extraction efficiency of GaN-based light-emitting diodes via surface roughening

Abstract: Roughened surfaces of light-emitting diodes (LEDs) provide substantial improvement in light extraction efficiency. By using the laser-lift-off technique followed by an anisotropic etching process to roughen the surface, an n-side-up GaN-based LED with a hexagonal “conelike” surface has been fabricated. The enhancement of the LED output power depends on the surface conditions. The output power of an optimally roughened surface LED shows a twofold to threefold increase compared to that of an LED before surface roughening.