Showing papers by "George M. Sheldrick published in 1971"
TL;DR: In this article, the molecular structure of F3SiNCO has been determined in the vapour phase by the sector microphotometer method of electron diffraction, consistent with an Si-N-C angle of 160.7±1.2°, and Si-F and SiN bond lengths of 1.553±0.004 and 1.648± 0.010 A respectively.
32 citations
TL;DR: The molecular structure of bis-(trifluoromethyl)nitroxyl, (CF3)2NO, has been determined in the vapour phase by the sector microphotometer electron diffraction method as mentioned in this paper.
Abstract: The molecular structure of bis-(trifluoromethyl)nitroxyl, (CF3)2NO, has been determined in the vapour phase by the sector microphotometer electron diffraction method. Principal structural parameters with estimated standard deviations in parentheses are: r(NO) 1·26(3), r(CN) 1·441(8), and r(CF) 1·320(4)A; F–C–F 109·8°(1·0°), C–N–C 120·9°(2·0°), C–N–O 117·2°(0·6°). The angle between the CNC plane and the NO bond is 22°(3°).
10 citations