Showing papers by "George M. Sheldrick published in 1972"
TL;DR: In this article, the molecular structures of silylphosphine and silyldimethylphosphines have been determined in the vapour phase by the sector-microphotometer method of electron diffraction.
Abstract: The molecular structures of silylphosphine, silylmethylphosphine, and silyldimethylphosphine have been determined in the vapour phase by the sector-microphotometer method of electron diffraction. The Si–P bond lengths are, respectively 2·249(3), 2·248(3), and 2·245(3)A. Substitution of SiH3 for H in mono- and di-methylphosphine does not appear to influence the C–P bond length. The C–P–C and C–P–Si angles lie in the range 99–101°, similar to the C–P–C angles in the methyl phosphines, but in contrast to the structural variations found in the series (H3Si)nNMe3 –n. The bonding in the silyl phosphines is discussed.
8 citations
TL;DR: The molecular structure of bis(trifluoromethyl)hydroxylamine, (CF3)2NOH, has been determined in the vapour phase by the sector microphotometer electron diffraction method.
Abstract: The molecular structure of bis(trifluoromethyl)hydroxylamine, (CF3)2NOH, has been determined in the vapour phase by the sector microphotometer electron diffraction method. Principal structural parameters with estimated standard deviations in parentheses are: r(N–O) 1·40(3), r(C–N) 1·435(fixed), and r(C–F) 1·322(2)A; F–C–F 109·8(0·4), C–N–C 120·6(1·3), C–N–O 111·3°(0·8°). The longer N–O bond and smaller sum of angles at nitrogen than in (CF3)2NO result in rather similar F⋯O distances in the two molecules.
4 citations