Gerd Binnig

Bio: Gerd Binnig is an academic researcher from IBM. The author has contributed to research in topics: Scanning tunneling microscope & Scanning probe microscopy. The author has an hindex of 37, co-authored 137 publications receiving 13110 citations. Previous affiliations of Gerd Binnig include Delphi Automotive & Seiko Instruments.

Tunneling through a controllable vacuum gap

Abstract: We report on the first successful tunneling experiment with an externally and reproducibly adjustable vacuum gap. The observation of vacuum tunneling is established by the exponential dependence of the tunneling resistance on the width of the gap. The experimental setup allows for simultaneous investigation and treatment of the tunnel electrode surfaces.

7 × 7 Reconstruction on Si(111) Resolved in Real Space

Abstract: The 7× 7 reconstruction on Si(111) was observed in real space by scanning tunneling microscopy. The experiment strongly favors a modified adatom model with 12 adatoms per unit cell and an inhomogeneously relaxed underlying top layer.

Scanning tunneling microscopy-from birth to adolescence

Abstract: We present here the historic development of Scanning Tunneling Microscopy (STM); the physical and technical aspects have already been covered in a few recent reviews and two conference proceedings' and many others are expected to follow in the near future. A technical summary is given by the sequence of figures, which stands alone. Our narrative is by no means a recommendation of how research should be done; it simply reflects what we thought, how we acted, and what we felt. However, it would certainly be gratifying if it encouraged a more relaxed attitude towards doing science. Perhaps we were fortunate in having common training in superconductivity, a field which radiates beauty and elegance. For scanning tunneling microscopy, we brought along some experience in tunneling (Binnig and Hoenig, 1978) and angstroms (Rohrer, 1960), but none in microscopy or surface science. This probably gave us the courage and lightheartedness to start something which should "not have worked in principle, " as we were so often told. "After havn on another occasion, I had been involved for a short time with tunneling between very small metallic grains in bistable resistors, and later I matched my colleagues struggle with tolerance problems in the fabrication of Josephson junctions. So the local study of growth and electrical properties of thin insulating layers appeared to me an interesting problem, and I was given the opportunity to hire a new research staff member, Gerd Binnig, who found it interesting, too, and accepted the offer. Incidentally, Gerd and I would have missed each other, had it not been for K. Alex Muller,

The "millipede" - nanotechnology entering data storage

Abstract: Present a new scanning-probe-based data-storage concept called the "millipede" that combines ultrahigh density, terabit capacity, small form factor, and high data rate. Ultrahigh storage density has been demonstrated by a new thermomechanical local-probe technique to store, read back, and erase data in very thin polymer films. With this new technique, nanometer-sized bit indentations and pitch sizes have been made by a single cantilever/tip into thin polymer layers, resulting in a data storage densities of up to 1 Tb/in/sup 2/. High data rates are achieved by parallel operation of large two-dimensional (2-D) atomic force microscope (AFM) arrays that have been batch-fabricated by silicon surface-micromachining techniques. The very large-scale integration (VLSI) of micro/nanomechanical devices (cantilevers/tips) on a single chip leads to the largest and densest 2-D array of 32/spl times/32 (1024) AFM cantilevers with integrated write/read/erase storage functionality ever built. Time-multiplexed electronics control the functional storage cycles for parallel operation of the millipede array chip. Initial areal densities of 100-200 Gb/in/sup 2/ have been achieved with the 32/spl times/32 array chip.

Atomic force microscope

Abstract: The scanning tunneling microscope is proposed as a method to measure forces as small as 10-18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 A and a vertical resolution less than 1 A.

WSXM: a software for scanning probe microscopy and a tool for nanotechnology.

Abstract: In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.

Surface studies by scanning tunneling microscopy

Abstract: Surface microscopy using vacuum tunneling is demonstrated for the first time. Topographic pictures of surfaces on an atomic scale have been obtained. Examples of resolved monoatomic steps and surface reconstructions are shown for (110) surfaces of CaIrSn 4 and Au.

Principles of nano-optics

Abstract: 1. Introduction 2. Theoretical foundations 3. Propagation and focusing of optical fields 4. Spatial resolution and position accuracy 5. Nanoscale optical microscopy 6. Near-field optical probes 7. Probe-sample distance control 8. Light emission and optical interaction in nanoscale environments 9. Quantum emitters 10. Dipole emission near planar interfaces 11. Photonic crystals and resonators 12. Surface plasmons 13. Forces in confined fields 14. Fluctuation-induced phenomena 15. Theoretical methods in nano-optics Appendices Index.