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Giovanni Pierattini

Researcher at ARCO

Publications -  128
Citations -  3364

Giovanni Pierattini is an academic researcher from ARCO. The author has contributed to research in topics: Digital holography & Holography. The author has an hindex of 25, co-authored 128 publications receiving 3222 citations. Previous affiliations of Giovanni Pierattini include Olivetti.

Papers
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Proceedings ArticleDOI

A novel interferometric spectrometer obtained by imaging Talbot effect in digital holography

TL;DR: In this article, a self-imaging phenomena is observed by reconstructing the amplitude of the object wavefield by using different distances and different illumination wavelengths, while maintaining constant the reconstruction distance.
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Evaluation of rigid rotations in flexural loading tests by holographic interferometry

TL;DR: In this article, a simple method based on holographic interferometry for determining the Poisson's ratio and the Young's modulus for a specimen subjected to four-point flexural testing that evaluates and eliminates the effects of the unwanted rigid body rotations was developed.
Proceedings ArticleDOI

Non-destructive optical system based on digital holographic microscope for quasi real-time characterization of micromechanical shunt switch

TL;DR: In this article, a digital holographic microscope (DHM) is employed as non-invasive metrological tool for inspection and characterisation of a micromechanical shunt switches in coplanar waveguide configuration (CPW) for microwave applications.
Proceedings ArticleDOI

Heterodyne interferometric measurement of the temperature coefficient of birefringence of quartz retardation plates

TL;DR: In this paper, a technique to measure concurrently the temperature dependence of quartz refractive indices in the thermal range 25 degree (s)C - 300 degree(s) C was discussed.
Journal ArticleDOI

Interferometric measurement of the refractive index and the thermo-optic coefficient of semiconductor-doped glasses

TL;DR: In this paper, an interferometric technique based on two-dimensional Fourier fringe analysis for measuring the refractive indices and the thermo-optic coefficients of semiconductor-doped glasses suitable for optical waveguide fabrication is presented.