G
Giovanni Pierattini
Researcher at ARCO
Publications - 128
Citations - 3364
Giovanni Pierattini is an academic researcher from ARCO. The author has contributed to research in topics: Digital holography & Holography. The author has an hindex of 25, co-authored 128 publications receiving 3222 citations. Previous affiliations of Giovanni Pierattini include Olivetti.
Papers
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Proceedings ArticleDOI
A novel interferometric spectrometer obtained by imaging Talbot effect in digital holography
Pietro Ferraro,Giuseppe Coppola,Domenico Alfieri,Sergio De Nicola,Simonetta Grilli,Andrea Finizio,Giovanni Pierattini +6 more
TL;DR: In this article, a self-imaging phenomena is observed by reconstructing the amplitude of the object wavefield by using different distances and different illumination wavelengths, while maintaining constant the reconstruction distance.
Journal ArticleDOI
Evaluation of rigid rotations in flexural loading tests by holographic interferometry
TL;DR: In this article, a simple method based on holographic interferometry for determining the Poisson's ratio and the Young's modulus for a specimen subjected to four-point flexural testing that evaluates and eliminates the effects of the unwanted rigid body rotations was developed.
Proceedings ArticleDOI
Non-destructive optical system based on digital holographic microscope for quasi real-time characterization of micromechanical shunt switch
V. Striano,Giuseppe Coppola,Pietro Ferraro,Domenico Alfieri,Sergio De Nicola,Andrea Finizio,Giovanni Pierattini,Romolo Marcelli,Paolo Mezzanotte +8 more
TL;DR: In this article, a digital holographic microscope (DHM) is employed as non-invasive metrological tool for inspection and characterisation of a micromechanical shunt switches in coplanar waveguide configuration (CPW) for microwave applications.
Proceedings ArticleDOI
Heterodyne interferometric measurement of the temperature coefficient of birefringence of quartz retardation plates
TL;DR: In this paper, a technique to measure concurrently the temperature dependence of quartz refractive indices in the thermal range 25 degree (s)C - 300 degree(s) C was discussed.
Journal ArticleDOI
Interferometric measurement of the refractive index and the thermo-optic coefficient of semiconductor-doped glasses
TL;DR: In this paper, an interferometric technique based on two-dimensional Fourier fringe analysis for measuring the refractive indices and the thermo-optic coefficients of semiconductor-doped glasses suitable for optical waveguide fabrication is presented.