Hideki Ina

Bio: Hideki Ina is an academic researcher. The author has contributed to research in topics: Interferometry & Moire Topography. The author has an hindex of 2, co-authored 2 publications receiving 7159 citations.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

Abstract: A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

Abstract: A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Thermoelectric generator without temperature difference and related measurement technologies

Abstract: We are developing a thermoelectric generator without temperature difference. It is a three-layer structure of an anode, a colloidal solvent containing nanoparticles (NPs), and a cathode. We also are developing a NPs manufacturing method which is called the laser-induced nucleation method using a femtosecond laser. Three kind of related measurement technologies will be introduced in this paper: (1) the non-scanning white light interferometry for the measurement of the gap between an anode and a cathode, (2) image processing technology from the transmission electron microscope images for the size distribution of sub10 nm-NPs, and (3) the color information from local surface plasmon resonance (LSPR) as an end monitor.

Fourier transform profilometry for the automatic measurement of 3-D object shapes

Abstract: A new computer-based technique for automatic 3-D shape measurement is proposed and verified by experiments. In contrast to the moire contouring technique, a grating pattern projected onto the object surface is Fourier-transformed and processed in its spatial frequency domain as well as in its space-signal domain. This technique has a much higher sensitivity than the conventional moire technique and is capable of fully automatic distinction between a depression and an elevation on the object surface. There is no requirement for assigning fringe orders and interpolating data in the regions between contour fringes. The technique is free from errors caused by spurious moire fringes generated by the higher harmonic components of the grating pattern.

Phase-shifting digital holography

Abstract: A new method for three-dimensional image formation is proposed in which the distribution of complex amplitude at a plane is measured by phase-shifting interferometry and then Fresnel transformed by a digital computer. The method can reconstruct an arbitrary cross section of a three-dimensional object with higher image quality and a wider viewing angle than from conventional digital holography using an off-axis configuration. Basic principles and experimental verification are described.

V Phase-Measurement Interferometry Techniques

Abstract: Publisher Summary This chapter describes the phase-measurement interferometry techniques. For all techniques, a temporal phase modulation is introduced to perform the measurement. By measuring the interferogram intensity as the phase is shifted, the phase of the wavefront can be determined with the aid of electronics or a computer. Phase modulation in an interferometer can be induced by moving a mirror, tilting a glass plate, moving a grating, rotating a half-wave plate or analyzer, using an acousto-optic or electro-optic modulator, or using a Zeeman laser. Phase-measurement techniques using analytical means to determine phase all have some common denominators. There are different equations for calculating the phase of a wavefront from interference fringe intensity measurements. The precision of a phase-measuring interferometer system can be determined by taking two measurements, subtracting them, and looking at the root-meansquare of the difference wavefront. The chapter discusses the simulation results. The elimination of the errors that reduce the measurement accuracy depends on the type of measurement being performed. Phase-measurement interferometry (PMI) can be applied to any two-beam interferometer, including holographic interferometers. Applications can be divided into: surface figure, surface roughness, and metrology.

Spectral phase interferometry for direct electric-field reconstruction of ultrashort optical pulses.

Abstract: We present a novel, self-referencing interferometric technique for measuring the amplitude and the phase of ultrashort optical pulses The apparatus uses a collinear geometry that requires no moving components The phase-retrieval procedure is noniterative and rapid and uses only two one-dimensional Fourier transforms We apply the technique to characterize ultrashort pulses from a mode-locked Ti:sapphire oscillator