H
Hiroyoshi Kazumori
Researcher at JEOL Ltd.
Publications - 11
Citations - 1805
Hiroyoshi Kazumori is an academic researcher from JEOL Ltd.. The author has contributed to research in topics: Scanning electron microscope & Lens (optics). The author has an hindex of 6, co-authored 11 publications receiving 1522 citations.
Papers
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Journal ArticleDOI
Large-Pore Apertures in a Series of Metal-Organic Frameworks
Hexiang Deng,Sergio Grunder,Kyle E. Cordova,Cory Valente,Hiroyasu Furukawa,Mohamad Hmadeh,Felipe Gándara,Adam C. Whalley,Zheng Liu,Shunsuke Asahina,Hiroyoshi Kazumori,Michael O'Keeffe,Osamu Terasaki,Osamu Terasaki,J. Fraser Stoddart,J. Fraser Stoddart,Omar M. Yaghi,Omar M. Yaghi +17 more
TL;DR: A strategy to expand the pore aperture of metal-organic frameworks (MOFs) into a previously unattained size regime (>32 angstroms) is reported, as evidenced by their permanent porosity and high thermal stability (up to 300°C).
Journal ArticleDOI
Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials
Mitsuo Suga,Shunsuke Asahina,Yusuke Sakuda,Hiroyoshi Kazumori,Hidetoshi Nishiyama,Takeshi Nokuo,Viveka Alfredsson,Tomas Kjellman,Sam M. Stevens,Hae Sung Cho,Minhyung Cho,Lu Han,Shunai Che,Michael W. Anderson,Ferdi Schüth,Hexiang Deng,Omar M. Yaghi,Zheng Liu,Hu Young Jeong,Andreas Stein,Kazuyuki Sakamoto,Ryong Ryoo,Osamu Terasaki,Osamu Terasaki +23 more
TL;DR: In this article, the authors present the theory and practical application of through-the-lens detection systems, which permit a reduced landing energy and the selection of high-resolution, topographically specific emitted electrons, even from electrically insulating nano-materials.
Patent
Charged-particle beam apparatus equipped with aberration corrector
TL;DR: In this paper, a charged-particle beam instrument with an aberration corrector is presented, which comprises four stages of electrostatic quadrupole elements, two stages of magnetic quadrupoles elements, and four stages for superimposing an electric octopole potential on the electric potential distribution created by the four stages.
Patent
Scanning electron microscope
TL;DR: A scanning electron microscope as mentioned in this paper consists of an electron gun for emitting an electron beam, a system of condenser lenses; scanning coils; and an objective lens having inner and outer magnetic polepieces to form a magnetic field lens below the lower ends of the polepieces.
Journal ArticleDOI
Field Emission SEM with a Spherical and Chromatic Aberration Corrector
TL;DR: A paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1-5, 2004 as discussed by the authors presents an extended abstract of the paper presented in this conference.