H
Hongtao Chen
Researcher at Harbin Institute of Technology
Publications - 63
Citations - 762
Hongtao Chen is an academic researcher from Harbin Institute of Technology. The author has contributed to research in topics: Microstructure & Soldering. The author has an hindex of 13, co-authored 52 publications receiving 513 citations.
Papers
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Journal ArticleDOI
Cu@Sn Core–Shell Structure Powder Preform for High-Temperature Applications Based on Transient Liquid Phase Bonding
TL;DR: In this paper, a die-attach material for high-temperature applications based on transient liquid phase (TLP) bonding is presented, which is suitable for power devices operating under high temperatures or other harsh environments.
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Cu6Sn5 precipitation during Sn-based solder/Cu joint solidification and its effects on the growth of interfacial intermetallic compounds
TL;DR: In this article, the precipitation behavior of Cu 6 Sn 5 during the solidification of Sn-based solders/Cu joints and its effect on the growth of interfacial intermetallic compounds (IMCs) was studied.
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Inhomogeneous deformation and microstructure evolution of Sn–Ag-based solder interconnects during thermal cycling and shear testing
TL;DR: Orientation imaging microscopy was adopted to characterize the microstructural changes in Sn–Ag-based solder interconnects during thermal cycling and shear testing, finding cracks were propagated intergranularly in the recrystallized microstructure.
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Die attach materials with high remelting temperatures created by bonding Cu@Sn microparticles at lower temperatures
Tianqi Hu,Hongtao Chen,Mingyu Li +2 more
TL;DR: In this paper, a die attach material that withstands high working temperatures of up to 676 °C after < 40 min of reflow at 250 °C was presented. But the die attach materials were preform compressed with Cu@Sn core-shell structured microparticles and the inner cores were interconnected by the formed network-like IMCs with a high remelting temperature of at least 415 °C.
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Microstructure, orientation and damage evolution in SnPb, SnAgCu, and mixed solder interconnects under thermomechanical stress
TL;DR: In this article, the microstructure, orientation evolution and failure modes of SnPb, SnAgCu, and mixed (SnAgCu bump+SnPb paste) solder interconnects were studied by thermal cycling between 0.oC and 100oC (with 15min dwell times and 15min ramps).