Hussain Al-Asaad

Bio: Hussain Al-Asaad is an academic researcher from University of California, Davis. The author has contributed to research in topics: Automatic test pattern generation & Redundancy (engineering). The author has an hindex of 8, co-authored 42 publications receiving 364 citations. Previous affiliations of Hussain Al-Asaad include Northeastern University & University of California.

Online BIST for embedded systems

Abstract: Embedded systems must meet increasingly high expectations of safety and high reliability. The authors survey online-testing techniques for identifying faults that can lead to system failure. They focus on online built-in self-test and its role in a comprehensive testing approach.

High-level design verification of microprocessors via error modeling

Abstract: A design verification methodology for microprocessor hardware based on modeling design errors and generating simulation vectors for the modeled errors via physical fault testing techniques is presented. We have systematically collected design error data from a number of microprocessor design projects. The error data is used to derive error models suitable for design verification testing. A class of basic error models is identified and shown to yield tests that provide good coverage of common error types. To improve coverage for more complex errors, a new class of conditional error models is introduced. An experiment to evaluate the effectiveness of our methodology is presented. Single actual design errors are injected into a correct design, and it is determined if the methodology will generate a test that detects the actual errors. The experiment has been conducted for two microprocessor designs and the results indicate that very high coverage of actual design errors can be obtained with test sets that are complete for a small number of synthetic error models.

Design verification via simulation and automatic test pattern generation

Abstract: We present a simulation-based method for combinational design verification that aims at complete coverage of specified design errors using conventional ATPG tools. The error models used in prior research are examined and reduced to four types: gate substitution errors (GSEs), gate count errors (GCEs), input count errors (ICEs), and wrong input errors (WIEs). Conditions are derived for a gate to be completely testable for GSEs. These conditions lend to small rest sets for GSEs. Near-minimal test sets are also derived for GCEs. We analyze redundancy in design errors and relate this to single stuck-line (SSL) redundancy. We show how to map all the foregoing error types into SSL faults, and describe an extensive set of experiments to evaluate the proposed method. Our experiments demonstrate that high coverage of the modeled design errors can be achieved with small test sets.

Automatically generating an input sequence for a circuit design using mutant-based verification

Abstract: One embodiment of the present invention provides a system that automatically generates an input sequence for a circuit design using mutant-based verification. During operation, the system receives a description of the circuit design. Next, the system determines a target value for a control signal in the description and a mutant value for the control signal. The system then determines if an input sequence exists for the circuit design that stimulates the control signal to the target value and causes the effects of the target value and the effects of the mutant value to reach an observation point in the circuit such that the effects of the target value and the effects of the mutant value differ at the observation point. If such an input sequence exists, the system then simulates operation of the circuit design using the input sequence. During simulation, the system generates two sets of signal outputs for the circuit design. The first set of signal outputs is affected by the target value for the control signal, while the second set of signal outputs is affected by the mutant value for the control signal.

Scalable Test Generators for High-Speed Datapath Circuits

Abstract: This paper explores the design of efficient test sets and test-pattern generators for on-line BIST. The target applications are high-performance, scalable datapath circuits for which fast and complete fault coverage is required. Because of the presence of carry-lookahead, most existing BIST methods are unsuitable for these applications. High-level models are used to identify potential test sets for a small version of the circuit to be tested. Then a regular test set is extracted and a test generator TG is designed to meet the following goals: scalability, small test set size, full fault coverage, and very low hardware overhead. TG takes the form of a twisted ring counter with a small decoder array. We apply our technique to various datapath circuits including a carry-lookahead adder, an arithmetic-logic unit, and a multiplier-adder.

Book Review: Design and Analysis of Fault-Tolerant Digital SystemsDesign and Analysis of Fault-Tolerant Digital Systems: JohnsonB. W. (Addison Wesley, 1989, 577 pp., £41.35)

Abstract: Design and Analysis ofFault-Tolerant Digital Systems: B. W. JOHNSON (Addison Wesley, 1989,577 pp., £41.35) The book provides an introduction to the important aspects of designing fault-tolerant systems, and an evaluation of how well the reliability goals have been achieved. The book is mainly oriented towards a final year undergraduate course on fault-tolerant computing, primarily with an implementation bias. In chapters 1 and 2, definitions and basic terminology are covered, which sets the stage for the remaining chapters, and provides the background and motivation for the remainder of the book. Chapter 3 provides a thorough analysis of fault-tolerance techniques and concepts. This chapter in particular is remarkably well written, covering the issues of hardware and information redundancy, which form the mainstay offault-tolerant computing. Subsequent chapters on the use and evaluation of the various approaches illustrate the principles as they have been put into practice. At the end of chapter 5, small projects that allow the reader to apply the material presented in the preceding chapters are included. The resurgence of interest in fault-tolerance with the emergence of VLSI is the theme of chapter 6, focussing on designing fault-tolerant systems in a VLSI environment. The problems and opportunities presented by VLSI are discussed and the use of redundancy techniques in order to enhance manufacturing yield and to provide in-service reliability are reviewed. The final chapter covers testing, design for testability and testability analysis, which must be considered during each phase of the design process to guarantee that resulting designs can be thoroughly tested. Each chapter is followed by a summary of the key issues and concepts presented therein, and a separate list of references, which makes it easily readable. In addition, there is a reading list with more comprehensive and specialised references devoted to each chapter. Overall, the book is well written, and contains a great deal of information in 577 pages. The book has a definite implementation bias, and draws considerably on the author's experience in industry, particularly reflected in the projects accompanying chapter 5. The book should be a useful addition to a library, and a suitable text to accompany a lecture course on fault-tolerant computing. R. RAMASWAMI, Department ofComputation, UMIST

Coverage metrics for functional validation of hardware designs

Abstract: Software simulation remains the primary means of functional validation for hardware designs. Coverage metrics ensure optimal use of simulation resources, measure the completeness of validation, and direct simulations toward unexplored areas of the design. This article surveys the literature, and discusses the experiences of verification practitioners, regarding coverage metrics.

BulletProof: a defect-tolerant CMP switch architecture

Abstract: As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transient errors, and transistor wear-out. Unless these challenges are addressed, computer vendors can expect low yields and short mean-times-to-failure. In this paper, we examine the challenges of designing complex computing systems in the presence of transient and permanent faults. We select one small aspect of a typical chip multiprocessor (CMP) system to study in detail, a single CMP router switch. To start, we develop a unified model of faults, based on the time-tested bathtub curve. Using this convenient abstraction, we analyze the reliability versus area tradeoff across a wide spectrum of CMP switch designs, ranging from unprotected designs to fully protected designs with online repair and recovery capabilities. Protection is considered at multiple levels from the entire system down through arbitrary partitions of the design. To better understand the impact of these faults, we evaluate our CMP switch designs using circuit-level timing on detailed physical layouts. Our experimental results are quite illuminating. We find that designs are attainable that can tolerate a larger number of defects with less overhead than naive triple-modular redundancy, using domain-specific techniques such as end-to-end error detection, resource sparing, automatic circuit decomposition, and iterative diagnosis and reconfiguration.

Reliable Computation Offloading for Edge-Computing-Enabled Software-Defined IoV

Abstract: Internet of Vehicles (IoV) has drawn great interest recent years. Various IoV applications have emerged for improving the safety, efficiency, and comfort on the road. Cloud computing constitutes a popular technique for supporting delay-tolerant entertainment applications. However, for advanced latency-sensitive applications (e.g., auto/assisted driving and emergency failure management), cloud computing may result in excessive delay. Edge computing, which extends computing and storage capabilities to the edge of the network, emerges as an attractive technology. Therefore, to support these computationally intensive and latency-sensitive applications in IoVs, in this article, we integrate mobile-edge computing nodes (i.e., mobile vehicles) and fixed edge computing nodes (i.e., fixed road infrastructures) to provide low-latency computing services cooperatively. For better exploiting these heterogeneous edge computing resources, the concept of software-defined networking (SDN) and edge-computing-aided IoV (EC-SDIoV) is conceived. Moreover, in a complex and dynamic IoV environment, the outage of both processing nodes and communication links becomes inevitable, which may have life-threatening consequences. In order to ensure the completion with high reliability of latency-sensitive IoV services, we introduce both partial computation offloading and reliable task allocation with the reprocessing mechanism to EC-SDIoV. Since the optimization problem is nonconvex and NP-hard, a heuristic algorithm, fault-tolerant particle swarm optimization algorithm is designed for maximizing the reliability (FPSO-MR) with latency constraints. Performance evaluation results validate that the proposed scheme is indeed capable of reducing the latency as well as improving the reliability of the EC-SDIoV.