Ieee Circuits

Bio: Ieee Circuits is an academic researcher. The author has contributed to research in topics: Delta-sigma modulation. The author has an hindex of 1, co-authored 1 publications receiving 1870 citations.

Delta-sigma data converters : theory, design, and simulation

Abstract: This comprehensive guide offers a detailed treatment of the analysis, design, simulation and testing of the full range of today's leading delta-sigma data converters. Written by professionals experienced in all practical aspects of deltasigma modulator design, Delta-Sigma Data Converters provides comprehensive coverage of low and high-order single-bit, bandpass, continuous-time, multistage modulators as well as advanced topics, including idle-channel tones, stability, decimation and interpolation filter design, and simulation.

Behavioral modeling of switched-capacitor sigma-delta modulators

Abstract: This paper presents a complete set of blocks implemented in the popular MATLAB SIMULINK environment, which allows designers to perform time-domain behavioral simulations of switched-capacitor (SC) sigma-delta (/spl Sigma//spl Delta/) modulators. The proposed set of blocks takes into account most of the SC /spl Sigma//spl Delta/ modulator nonidealities, such as sampling jitter, kT/C noise, and operational amplifier parameters (white noise, finite DC gain, finite bandwidth, slew rate and saturation voltages). For each block, a description of the considered effect as well as all of the implementative details are provided. The proposed simulation environment is validated by comparing the simulated behavior with the experimental results obtained from two actual circuits, namely a second-order low-pass and a sixth-order bandpass SC /spl Sigma//spl Delta/ modulator.

A CMOS smart temperature sensor with a 3/spl sigma/ inaccuracy of /spl plusmn/0.1/spl deg/C from -55/spl deg/C to 125/spl deg/C

Abstract: A low-cost temperature sensor with on-chip sigma-delta ADC and digital bus interface was realized in a 0.5 /spl mu/m CMOS process. Substrate PNP transistors are used for temperature sensing and for generating the ADC's reference voltage. To obtain a high initial accuracy in the readout circuitry, chopper amplifiers and dynamic element matching are used. High linearity is obtained by using second-order curvature correction. With these measures, the sensor's temperature error is dominated by spread on the base-emitter voltage of the PNP transistors. This is trimmed after packaging by comparing the sensor's output with the die temperature measured using an extra on-chip calibration transistor. Compared to traditional calibration techniques, this procedure is much faster and therefore reduces production costs. The sensor is accurate to within /spl plusmn/0.5/spl deg/C (3/spl sigma/) from -50/spl deg/C to 120/spl deg/C.

A 12-Bit, 10-MHz Bandwidth, Continuous-Time $\Sigma\Delta$ ADC With a 5-Bit, 950-MS/s VCO-Based Quantizer

Abstract: The use of VCO-based quantization within continuous-time (CT) SigmaDelta analog-to-digital converter (ADC) structures is explored, with a custom prototype in 0.13 mum CMOS showing measured performance of 86/72 dB SNR/SNDR with 10 MHz bandwidth while consuming 40 mW from a 1.2 V supply and occupying an active area of 640 mum times 660 mum. A key element of the ADC structure is a 5-bit VCO-based quantizer clocked at 950 MHz which achieves first-order noise shaping of its quantization noise. The quantizer structure allows the second-order CT SigmaDelta ADC topology to achieve third-order noise shaping, and direct connection of the VCO-based quantizer to the internal DACs of the ADC provides intrinsic dynamic element matching of the DAC elements.

Excess loop delay in continuous-time delta-sigma modulators

Abstract: Continuous-time (CT) delta-sigma modulators (/spl Delta//spl Sigma/M's) suffer from a problem not seen in discrete-time (DT) designs, that of excess loop delay: nonzero delay between the quantizer clock edge and the time when a change in output bit is seen at the feedback point in the modulator. This paper analytically shows how such delay affects the equivalence between the CT modulator loop filter and its DT counterpart. The effect of this delay on modulator dynamic range is studied through simulation for the standard double-integration (low pass) CT modulator and its equivalent fourth-order f/sub s//4 band pass circuit. For the first time, the results are extended to higher order low-pass and bandpass designs, as well as multibit designs. Methods for alleviating the performance loss caused by excess loop delay are also discussed.

A 20-mW 640-MHz CMOS Continuous-Time $\Sigma\Delta$ ADC With 20-MHz Signal Bandwidth, 80-dB Dynamic Range and 12-bit ENOB

Abstract: A wide bandwidth continuous-time sigma-delta ADC, operating between 20 and 40 MS/s output data rate, is implemented in 130-nm CMOS. The circuit is targeted for applications that demand high bandwidth, high resolution, and low power, such as wireless and wireline communications, medical imaging, video, and instrumentation. The third-order continuous-time SigmaDelta modulator comprises a third-order RC operational-amplifier-based loop filter and 4-bit internal quantizer operating at 640 MHz. A 400-fs rms jitter LC PLL with 450-kHz bandwidth is integrated, generating the low-jitter clock for the jitter-sensitive continuous-time SigmaDelta ADC from a single-ended input clock between 13.5 and 40 MHz. To reduce clock jitter sensitivity, nonreturn-to-zero (NRZ) DAC pulse shaping is used. The excess loop delay is set to half the sampling period of the quantizer and the degradation of modulator stability due to excess loop delay is avoided with a new architecture. The SigmaDelta ADC achieves 76-dB SNR, -78-dB THD, and a 74-dB SNDR or 12 ENOB over a 20-MHz signal band at an OSR of 16. The power consumption of the CT SigmaDelta modulator itself is 20 mW and in total the ADC dissipates 58 mW from the 1.2-V supply