J
J. Fredrik Creemer
Researcher at Delft University of Technology
Publications - 8
Citations - 563
J. Fredrik Creemer is an academic researcher from Delft University of Technology. The author has contributed to research in topics: Piezoresistive effect & Scanning transmission X-ray microscopy. The author has an hindex of 4, co-authored 8 publications receiving 518 citations.
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Journal ArticleDOI
Nanoscale chemical imaging of a working catalyst by scanning transmission X-ray microscopy
Emiel de Smit,Ingmar Swart,J. Fredrik Creemer,Gerard H. Hoveling,Mary K. Gilles,Tolek Tyliszczak,Patricia J. Kooyman,Henny W. Zandbergen,Cynthia Morin,Bert M. Weckhuysen,Frank M. F. de Groot +10 more
TL;DR: Scanning transmission X-ray microscopy can be used at atmospheric pressure and up to 350 °C to monitor in situ phase changes in a complex iron-based Fisher–Tropsch catalyst and the nature and location of carbon species produced.
Journal ArticleDOI
Atomic imaging of phase transitions and morphology transformations in nanocrystals.
Marijn A. van Huis,Neil P. Young,Gregory Pandraud,J. Fredrik Creemer,Daniel Vanmaekelbergh,Angus I. Kirkland,Henny W. Zandbergen +6 more
TL;DR: Morphological transformations in gold nanoparticles and layer-by-layer sublimation of PbSe nanocrystals is imaged with atomic resolution.
Journal ArticleDOI
Nanoscale Chemical Imaging of the Reduction Behavior of a Single Catalyst Particle
Emiel de Smit,Ingmar Swart,J. Fredrik Creemer,Chithra Karunakaran,Drew Bertwistle,Henny W. Zandbergen,Frank M. F. de Groot,Bert M. Weckhuysen +7 more
TL;DR: Investigation of the reduction properties of a single Fischer-Tropsch catalyst particle, using in situ scanning transmission X-ray microscopy with spatial resolution of 35 nm, reveals a heterogeneous distribution of Fe(0), Fe(2+), and Fe(3+) species.
Journal ArticleDOI
In-situ scanning transmission X-ray microscopy of catalytic materials under reaction conditions
Emiel de Smit,J. Fredrik Creemer,Henny W. Zandbergen,Bert M. Weckhuysen,Frank M. F. de Groot +4 more
TL;DR: In this paper, in-situ scanning X-ray transmission microscopy (STXM-XAS) is combined with a micromachined nanoreactor to image a catalytic system under relevant reaction conditions, and provide detailed information on the morphology and composition of the catalyst material.
Proceedings ArticleDOI
Reduction of uncertainty in the measurement of the piezoresistive coefficients of silicon with a three-element rosette
TL;DR: In this article, it was shown that the accuracy of piezoresistive based silicon sensors is partially determined by the uncertainty in the piezoreistive coefficients, which arises from errors in the resistance measurements.