J. Grzanna

Bio: J. Grzanna is an academic researcher. The author has contributed to research in topics: Interferometry & Fizeau interferometer. The author has an hindex of 8, co-authored 8 publications receiving 1085 citations.

Digital wave-front measuring interferometry: some systematic error sources.

Abstract: Digital wave-front measuring interferometry is a well-established technique but only few investigations of systematic error sources have been carried out so far. In this work three especially serious error sources are discussed in some detail: inaccuracies of the reference phase values needed for this type of evaluation technique; disturbances due to extraneous fringes; and spatially high frequency noise on the wave fronts caused by dust particles, inhomogeneities, etc. For the first two error sources formulas of the resulting phase deviation are derived and compensation possibilities discussed and experimentally verified. To study the occurrence of wave-front irregularities caused by dust particles a model has been developed and countermeasures derived which assure sufficient regularity of contour line plots. The repeatability of the present experimental setup was better than λ/200 within the 3σ limits.

Absolute flatness testing by the rotation method with optimal measuring-error compensation

Abstract: The rotation method for the absolute testing of three flats by the evaluation of four interference patterns of pairs of these flats is developed further. Least-squares methods for determining and minimizing the effect of random measuring errors are fully applied. This application makes an optimal resolution in depth and an enhanced lateral resolution possible. The computational effort mainly consists of a repeated solution of a linear equation system with 3N unknowns if N diameters of each flat are to be evaluated. The rms error of determining a flatness deviation is calculated as a function of the rms measuring error, the desired lateral resolution, and the position on the surface. The algorithm is extended to the case of using square-grid detector arrays by a special interpolation method.

Absolute sphericity measurement

Abstract: Several conventional methods for absolute sphericity testing of optical surfaces are known. One method has been used previously for real time interferometry, but a detailed investigation has not been carried out so far. In this work the known conventional methods are reviewed and assessed for suitability in real time interferometry. One method has been applied to phase stepping interferometry and examined. Adjustment peculiarities, experimental results of deviation measurements on normal surfaces, and application of normals are reported. Measuring errors, especially coherent noise, are analyzed and a special subsequent digital spatial filtering technique for diminution of noise is described.

Homogeneity testing by phase sampling interferometry.

Abstract: In diffraction-limited optical systems the number of optical components is rather high. Local changes in the refractive index of the order of 10−6 must be detected to guarantee an adequate performance of the system as a whole. Therefore, the Twyman-Perry method for the evaluation of refractive-index deviations from uniformity—further developed by Roberts and Langenbeck—has been programmed for a digital Twy-man-Green interferometer. If the glass block to be tested is slightly wedge shaped (wedge angle ~10−3 rad), the measurement can be carried out without coating the glass block. With the help of four interferograms the variations of the refractive index apart from a linear slope, as well as the thickness variations of the glass block, can be measured and displayed.

Establishing a flatness standard

Abstract: A further-developed three-plate rotation method [Appl. Opt. 31, 3767 (1992)] for the absolute testing of flats is used as a measuring method for establishing flatness standards. A special phase-stepping Fizeau interferometer was built that permits flats of diameters up to 200 mm to be tested. First results show a mean error between 0.002 and 0.003 λ in the determination of the absolute flatness deviations (λ = 632.8 nm). These deviations are obtained at 500-600 points on each plate. A number of experimental conditions connected with the thermal and mechanical stability of the plates must be fulfilled.

Optical Coherence Tomography

Abstract: Optical coherence tomography (OCT) has developed rapidly since its first realisation in medicine and is currently an emerging technology in the diagnosis of skin disease. OCT is an interferometric technique that detects reflected and backscattered light from tissue and is often described as the optical analogue to ultrasound. The inherent safety of the technology allows for in vivo use of OCT in patients. The main strength of OCT is the depth resolution. In dermatology, most OCT research has turned on non-melanoma skin cancer (NMSC) and non-invasive monitoring of morphological changes in a number of skin diseases based on pattern recognition, and studies have found good agreement between OCT images and histopathological architecture. OCT has shown high accuracy in distinguishing lesions from normal skin, which is of great importance in identifying tumour borders or residual neoplastic tissue after therapy. The OCT images provide an advantageous combination of resolution and penetration depth, but specific studies of diagnostic sensitivity and specificity in dermatology are sparse. In order to improve OCT image quality and expand the potential of OCT, technical developments are necessary. It is suggested that the technology will be of particular interest to the routine follow-up of patients undergoing non-invasive therapy of malignant or premalignant keratinocyte tumours. It is speculated that the continued technological development can propel the method to a greater level of dermatological use.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

Abstract: A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Optical coherence tomography - principles and applications

Abstract: There have been three basic approaches to optical tomography since the early 1980s: diffraction tomography, diffuse optical tomography and optical coherence tomography (OCT). Optical techniques are of particular importance in the medical field, because these techniques promise to be safe and cheap and, in addition, offer a therapeutic potential. Advances in OCT technology have made it possible to apply OCT in a wide variety of applications but medical applications are still dominating. Specific advantages of OCT are its high depth and transversal resolution, the fact, that its depth resolution is decoupled from transverse resolution, high probing depth in scattering media, contact-free and non-invasive operation, and the possibility to create various function dependent image contrasting methods. This report presents the principles of OCT and the state of important OCT applications. OCT synthesises cross-sectional images from a series of laterally adjacent depth-scans. At present OCT is used in three different fields of optical imaging, in macroscopic imaging of structures which can be seen by the naked eye or using weak magnifications, in microscopic imaging using magnifications up to the classical limit of microscopic resolution and in endoscopic imaging, using low and medium magnification. First, OCT techniques, like the reflectometry technique and the dual beam technique were based on time-domain low coherence interferometry depth-scans. Later, Fourier-domain techniques have been developed and led to new imaging schemes. Recently developed parallel OCT schemes eliminate the need for lateral scanning and, therefore, dramatically increase the imaging rate. These schemes use CCD cameras and CMOS detector arrays as photodetectors. Video-rate three-dimensional OCT pictures have been obtained. Modifying interference microscopy techniques has led to high-resolution optical coherence microscopy that achieved sub-micrometre resolution. This report is concluded with a short presentation of important OCT applications. Ophthalmology is, due to the transparent ocular structures, still the main field of OCT application. The first commercial instrument too has been introduced for ophthalmic diagnostics (Carl Zeiss Meditec AG). Advances in using near-infrared light, however, opened the path for OCT imaging in strongly scattering tissues. Today, optical in vivo biopsy is one of the most challenging fields of OCT application. High resolution, high penetration depth, and its potential for functional imaging attribute to OCT an optical biopsy quality, which can be used to assess tissue and cell function and morphology in situ. OCT can already clarify the relevant architectural tissue morphology. For many diseases, however, including cancer in its early stages, higher resolution is necessary. New broad-bandwidth light sources, like photonic crystal fibres and superfluorescent fibre sources, and new contrasting techniques, give access to new sample properties and unmatched sensitivity and resolution.

V Phase-Measurement Interferometry Techniques

Abstract: Publisher Summary This chapter describes the phase-measurement interferometry techniques. For all techniques, a temporal phase modulation is introduced to perform the measurement. By measuring the interferogram intensity as the phase is shifted, the phase of the wavefront can be determined with the aid of electronics or a computer. Phase modulation in an interferometer can be induced by moving a mirror, tilting a glass plate, moving a grating, rotating a half-wave plate or analyzer, using an acousto-optic or electro-optic modulator, or using a Zeeman laser. Phase-measurement techniques using analytical means to determine phase all have some common denominators. There are different equations for calculating the phase of a wavefront from interference fringe intensity measurements. The precision of a phase-measuring interferometer system can be determined by taking two measurements, subtracting them, and looking at the root-meansquare of the difference wavefront. The chapter discusses the simulation results. The elimination of the errors that reduce the measurement accuracy depends on the type of measurement being performed. Phase-measurement interferometry (PMI) can be applied to any two-beam interferometer, including holographic interferometers. Applications can be divided into: surface figure, surface roughness, and metrology.

Digital wavefront measuring interferometer for testing optical surfaces and lenses

Abstract: A self-scanned 1024 element photodiode array and minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100. The photodiode array samples intensities over a 32 x 32 matrix in the interference pattern as the length of the reference arm is varied piezoelectrically. Using these data the minicomputer synchronously detects the phase at each of the 1024 points by a Fourier series method and displays the wavefront in contour and perspective plot on a storage oscilloscope in less than 1 min (Bruning et al. Paper WE16, OSA Annual Meeting, Oct. 1972). The array of intensities is sampled and averaged many times in a random fashion so that the effects of air turbulence, vibrations, and thermal drifts are minimized. Very significant is the fact that wavefront errors in the interferometer are easily determined and may be automatically subtracted from current or subsequent wavefrots. Various programs supporting the measurement system include software for determining the aperture boundary, sum and difference of wavefronts, removal or insertion of tilt and focus errors, and routines for spatial manipulation of wavefronts. FFT programs transform wavefront data into point spread function and modulus and phase of the optical transfer function of lenses. Display programs plot these functions in contour and perspective. The system has been designed to optimize the collection of data to give higher than usual accuracy in measuring the individual elements and final performance of assembled diffraction limited optical systems, and furthermore, the short loop time of a few minutes makes the system an attractive alternative to constraints imposed by test glasses in the optical shop.