J
J.-Q. Xi
Researcher at Rensselaer Polytechnic Institute
Publications - 29
Citations - 2729
J.-Q. Xi is an academic researcher from Rensselaer Polytechnic Institute. The author has contributed to research in topics: Light-emitting diode & Refractive index. The author has an hindex of 16, co-authored 29 publications receiving 2576 citations.
Papers
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Journal ArticleDOI
Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection
J.-Q. Xi,Martin F. Schubert,Jong Kyu Kim,E. Fred Schubert,Minfeng Chen,Shawn-Yu Lin,W. Liu,J. A. Smart +7 more
TL;DR: Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection were used in this paper, where the authors proposed a method to eliminate the reflection in optical thin-films.
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Solid-state lighting?a benevolent technology
TL;DR: In this article, the impact of solid-state lighting technology on energy consumption, the environment and on emerging application fields that make use of the controllability afforded by solid state sources is assessed.
Journal ArticleDOI
Junction and carrier temperature measurements in deep-ultraviolet light-emitting diodes using three different methods
Y. Xi,J.-Q. Xi,Th. Gessmann,Jay M. Shah,Jong Kyu Kim,Erdmann Frederick Schubert,Arthur J. Fischer,Mary H. Crawford,K. H. A. Bogart,Andrew A. Allerman +9 more
TL;DR: In this article, the junction temperature of AlGaN ultraviolet light-emitting diodes emitting at 295nm is measured by using the temperature coefficients of the diode forward voltage and emission peak energy.
Journal ArticleDOI
GaInN light-emitting diode with conductive omnidirectional reflector having a low-refractive-index indium-tin oxide layer
Jong Kyu Kim,Thomas Gessmann,E. Fred Schubert,J.-Q. Xi,Hong Luo,Jaehee Cho,Cheolsoo Sone,Yongjo Park +7 more
TL;DR: In this paper, a GaInN light-emitting diode (LED) employing a conductive omnidirectional reflector (ODR) consisting of GaN, an indium-tin oxide (ITO) nanorod low-refractive index layer, and an Ag layer is presented.
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Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material
TL;DR: In this paper, a conductive distributed Bragg reflector (DBR) composed entirely of a single material (indium tin oxide (ITO)) is reported, and the high and low-refractive index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index contrast of Δn=0.4.