J. Silva

Bio: J. Silva is an academic researcher from Oregon State University. The author has contributed to research in topics: Delta-sigma modulation & Switched capacitor. The author has an hindex of 9, co-authored 11 publications receiving 1081 citations.

Wideband low-distortion delta-sigma ADC topology

Abstract: A /spl Delta//spl Sigma/ topology with reduced sensitivity to opamp nonlinearities is described. The technique is effective even for very low oversampling ratios, and can be used for any modulation order. Techniques for reducing other nonideal effects are also proposed.

Theory and applications of incremental /spl Delta//spl Sigma/ converters

Abstract: Analog-Digital (A/D) converters used in instrumentation and measurements often require high absolute accuracy, including very high linearity and negligible dc offset. The realization of high-resolution Nyquist-rate converters becomes very expensive when the resolution exceeds 16 bits. The conventional delta-sigma (/spl Delta//spl Sigma/) structures used in telecommunication and audio applications usually cannot satisfy the requirements of high absolute accuracy and very small offset. The incremental (or integrating) converter provides a solution for such measurement applications, as it has most advantages of the /spl Delta//spl Sigma/ converter, yet is capable of offset-free and accurate conversion. In this paper, theoretical and practical aspects of higher order incremental converters are discussed. The operating principles, topologies, specialized digital filter design methods, and circuit level issues are all addressed. It is shown how speed, resolution, and A/D complexity can be optimized for a given design, and how with some special digital filters improved speed/resolution ratio can be achieved. The theoretical results are verified by showing design examples and simulation results.

Adaptive digital correction of analog errors in MASH ADCs. II. Correction using test-signal injection

Abstract: For pt. I see ibid., vol. 47, no. 7, p. 621-8 (2000). This part describes a different adaptation strategy. It relies on the injection of a pseudorandom two-level test signal at the input of the first-stage quantizer, where it is added to the quantization noise. The test signal then leaks into the output signal, where it can be detected and used to control the digital noise-cancellation filter. This paper describes the correction process, as well as some efficient structures for implementing it, and demonstrates the effectiveness of the technique by describing three design examples.

Low-distortion delta-sigma topologies for MASH architectures

Abstract: This paper describes low-distortion delta-sigma topologies with significant system and circuit-level advantages over traditional delta-sigma topologies, especially for wideband (low oversampling ratio) applications. A comparison between traditional and low-distortion MASH topologies shows how the latter can achieve higher performance while requiring smaller silicon area and power consumption.

A switched-capacitor DAC with analog mismatch correction

Abstract: This paper describes a background calibration method for enhancing the accuracy and linearity of a switched-capacitor digital-to-analog converter. It can be used alone or in combination with mismatch shaping to achieve very high accuracy and linearity combined with high speed.

Wideband low-distortion delta-sigma ADC topology

Abstract: A /spl Delta//spl Sigma/ topology with reduced sensitivity to opamp nonlinearities is described. The technique is effective even for very low oversampling ratios, and can be used for any modulation order. Techniques for reducing other nonideal effects are also proposed.

Theory and applications of incremental /spl Delta//spl Sigma/ converters

Abstract: Analog-Digital (A/D) converters used in instrumentation and measurements often require high absolute accuracy, including very high linearity and negligible dc offset. The realization of high-resolution Nyquist-rate converters becomes very expensive when the resolution exceeds 16 bits. The conventional delta-sigma (/spl Delta//spl Sigma/) structures used in telecommunication and audio applications usually cannot satisfy the requirements of high absolute accuracy and very small offset. The incremental (or integrating) converter provides a solution for such measurement applications, as it has most advantages of the /spl Delta//spl Sigma/ converter, yet is capable of offset-free and accurate conversion. In this paper, theoretical and practical aspects of higher order incremental converters are discussed. The operating principles, topologies, specialized digital filter design methods, and circuit level issues are all addressed. It is shown how speed, resolution, and A/D complexity can be optimized for a given design, and how with some special digital filters improved speed/resolution ratio can be achieved. The theoretical results are verified by showing design examples and simulation results.

Sigma-Delta Modulators: Tutorial Overview, Design Guide, and State-of-the-Art Survey

Abstract: This paper presents a tutorial overview of ΣΔ modulators, their operating principles and architectures, circuit errors and models, design methods, and practical issues. A review of the state of the art on nanometer CMOS implementations is described, giving a survey of cutting-edge ΣΔ architectures, with emphasis on their application to the next generation of wireless telecom systems.

A CMOS Temperature Sensor With a Voltage-Calibrated Inaccuracy of $\pm$ 0.15 $ ^{\circ}$ C (3 $\sigma$ ) From $-$ 55 $^{\circ}$ C to 125 $^{\circ}$ C

Abstract: This paper describes the design of a low power, energy-efficient CMOS smart temperature sensor intended for RFID temperature sensing. The BJT-based sensor employs an energy- efficient 2nd-order zoom ADC, which combines a coarse 5-bit SAR conversion with a fine 10-bit ΔΣ conversion. Moreover, a new integration scheme is proposed that halves the conversion time, while requiring no extra supply current. To meet the stringent cost constraints on RFID tags, a fast voltage calibration technique is used, which can be carried out in only 200 msec. After batch calibration and an individual room-temperature calibration, the sensor achieves an inaccuracy of ±0.15°C (3σ) from -55°C to 125°C . Over the same range, devices from a second lot achieved an inaccuracy of ±0.25°C (3σ) in both ceramic and plastic packages. The sensor occupies 0.08 mm2 in a 0.16 μm CMOS process, draws 3.4 μA from a 1.5 V to 2 V supply, and achieves a resolution of 20 mK in a conversion time of 5.3 msec. This corresponds to a minimum energy dissipation of 27 nJ per conversion.

CMOS Image Sensor With Per-Column ΣΔ ADC and Programmable Compressed Sensing

Abstract: A CMOS image sensor architecture with built-in single-shot compressed sensing is described. The image sensor employs a conventional 4-T pixel and per-column ΣΔ ADCs. The compressed sensing measurements are obtained via a column multiplexer that sequentially applies randomly selected pixel values to the input of each ΣΔ modulator. At the end of readout, each ADC outputs a quantized value of the average of the pixel values applied to its input. The image is recovered from the random linear measurements off-chip using numerical optimization algorithms. To demonstrate this architecture, a 256x256 pixel CMOS image sensor is fabricated in 0.15 μm CIS process. The sensor can operate in compressed sensing mode with compression ratio 1/4, 1/8, or 1/16 at 480, 960, or 1920 fps, respectively, or in normal capture mode with no compressed sensing at a maximum frame rate of 120 fps. Measurement results demonstrate capture in compressed sensing mode at roughly the same readout noise of 351 μVrms and power consumption of 96.2 mW of normal capture at 120 fps. This performance is achieved with only 1.8% die area overhead. Image reconstruction shows modest quality loss relative to normal capture and significantly higher image quality than downsampling.