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James C. Tsang

Researcher at IBM

Publications -  107
Citations -  8617

James C. Tsang is an academic researcher from IBM. The author has contributed to research in topics: Raman spectroscopy & Raman scattering. The author has an hindex of 41, co-authored 107 publications receiving 8346 citations. Previous affiliations of James C. Tsang include Purdue University & MESA+ Institute for Nanotechnology.

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Electrically Induced Optical Emission from a Carbon Nanotube FET

TL;DR: Electrical measurements show that the observed optical emission originates from radiative recombination of electrons and holes that are simultaneously injected into the undoped nanotubes, consistent with a nanotube FET model in which thin Schottky barriers form at the source and drain contacts.
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Photocurrent imaging and efficient photon detection in a graphene transistor

TL;DR: It is shown that at a certain gate bias, the impact of the metal on the channel potential profile extends into the channel for more than one-third of the total channel length from both source and drain sides; hence, most of the channel is affected by the metal.
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Enhancement of the Infrared Absorption from Molecular Monolayers with Thin Metal Overlayers

TL;DR: In this article, the infrared absorption from molecular monolayers is enhanced by thin metal overlayers or underlayers with use of the attenuated-total-reflection technique, which is consistent with an electric field enhancement due to collective electron resonances associated with the island nature of the thin metal films.
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Chemical doping and electron-hole conduction asymmetry in graphene devices.

TL;DR: Simulations based on nonequilibrium Green's function formalism suggest that the origin of this asymmetry in transport in graphene devices doped with poly(ethylene imine) and diazonium salts is imbalanced carrier injection from the graphene electrodes caused by misalignment of the electrode and channel neutrality points.
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Role of contacts in graphene transistors: A scanning photocurrent study

TL;DR: In this paper, a near-field scanning optical microscope is used to induce photocurrent in a graphene transistor with high spatial resolution, and the authors find that in the $n$-type conduction regime a $p\text{\ensuremath{-n\text{-p$ structure forms along the graphene device due to the doping of the graphene by the metal contacts.