J
Janak H. Patel
Researcher at University of Illinois at Urbana–Champaign
Publications - 168
Citations - 9261
Janak H. Patel is an academic researcher from University of Illinois at Urbana–Champaign. The author has contributed to research in topics: Automatic test pattern generation & Fault coverage. The author has an hindex of 48, co-authored 168 publications receiving 9113 citations. Previous affiliations of Janak H. Patel include University of Manchester & Royal Free Hospital.
Papers
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Proceedings ArticleDOI
HITEC: a test generation package for sequential circuits
TL;DR: HITEC is presented, a sequential circuit test generation package to generate test patterns for sequential circuits, without assuming the use of scan techniques or a reset state, and several new techniques are introduced to improve the performance of test generation.
Proceedings ArticleDOI
A low-overhead coherence solution for multiprocessors with private cache memories
TL;DR: This paper presents a cache coherence solution for multiprocessors organized around a single time-shared bus that aims at reducing bus traffic and hence bus wait time and increases the overall processor utilization.
Proceedings ArticleDOI
Test set compaction algorithms for combinational circuits
Ilker Hamzaoglu,Janak H. Patel +1 more
TL;DR: In this paper, two new algorithms, redundant vector elimination (RVE) and essential fault reduction (EFR), were proposed for generating compact test sets for combinational circuits under the single stuck at fault model.
Journal Article
Guidance for control of infections with carbapenem-resistant or carbapenemase-producing Enterobacteriaceae in acute care facilities.
W. Lledo,M. Hernandez,E. Lopez,O. L. Molinari,Raimundo Soto,E. Hernandez,N. Santiago,M. Flores,G. J. Vazquez,I. E. Robledo,E. Garcia-Rivera,Ana Cortés,M. Ramos,Richard V. Goering,Arjun Srinivasan,Carolyn V. Gould,N. Stine,Michael Bell,K. Anderson,B. Kitchel,Betty Wong,J. K. Rasheed,Janak H. Patel,Kay M. Tomashek,E. Llata +24 more
TL;DR: In this paper, the authors provide updated recommendations from CDC and the Healthcare Infection Control Practices Advisory Committee (HICPAC) for the control of CRE or carbapenemase-producing Enterobacteriaceae in acute care (inpatient) facilities.
Proceedings ArticleDOI
Reducing test application time for full scan embedded cores
Ilker Hamzaoglu,Janak H. Patel +1 more
TL;DR: In this article, the authors proposed a parallel serial full scan (PSFS) technique for reducing the test application time for full scan embedded cores, which divides the scan chain into multiple partitions and shifts in the same vector to each scan chain through a single scan in input.