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Jean-Michel Portal

Researcher at Centre national de la recherche scientifique

Publications -  145
Citations -  2335

Jean-Michel Portal is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: Resistive random-access memory & Artificial neural network. The author has an hindex of 25, co-authored 136 publications receiving 2047 citations. Previous affiliations of Jean-Michel Portal include Alternatives & Aix-Marseille University.

Papers
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Book ChapterDOI

SRAM-Based FPGAs: A Fault Model for the Configurable Logig Modules

TL;DR: This paper state that the stuck-at fault model can be used on such a description when multiplexer-based module are under consideration and validate this assumption by generating a test sequence for the functional description assuming a stuck- at fault model of the input/output.
Book ChapterDOI

Binary OxRAM/CBRAM Memories for Efficient Implementations of Embedded Neuromorphic Circuits

TL;DR: This chapter describes an artificial synapse composed of multiple binary resistive RAM (RRAM) cells connected in parallel, thereby providing synaptic analog behavior and the RRAM-based synapse coupled with unsupervised learning has been proposed to perform real-time decoding of complex brain signals using a R RAM-based fully connected neural network.
Proceedings ArticleDOI

Improvement of a VCO concept for low energy particule detection and recognition

TL;DR: A way of improvement of an oscillator concept, dedicated to detection and tracking of low energy particles with low fluxes, is presented, based on an indirect detection of the current generated at the input of the detection chain through a VCO response.
Journal ArticleDOI

Phase-change memory: A continuous multilevel compact model of subthreshold conduction and threshold switching

TL;DR: In this paper, a phase change memory (PCM) compact modeling of the threshold switching based on a thermal runaway in Poole-Frenkel conduction is proposed, and a good convergence is exhibited even in snapback simulation owing to this fully continuous approach.
Proceedings ArticleDOI

Fast Embedded Characterization of FEOL Variations in MOS Devices

TL;DR: In this article, the authors present a test chip based on embedded ring oscillators (RO) measurement with its associated extraction algorithm to characterize length and width variations and to discriminate them from others FEOL variations.