J
Jean-Michel Portal
Researcher at Centre national de la recherche scientifique
Publications - 145
Citations - 2335
Jean-Michel Portal is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: Resistive random-access memory & Artificial neural network. The author has an hindex of 25, co-authored 136 publications receiving 2047 citations. Previous affiliations of Jean-Michel Portal include Alternatives & Aix-Marseille University.
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Memoire non volatile favorisant une grande densite d'integration
TL;DR: In this paper, a memoire non volatile (1), comprenant : -des transistors de selection (3, 4) comportant chacun: -une couche en materiau semi-conducteur avec une zone de canal (30) and des premiere and deuxieme electrodes de conduction (32, 31); -un empilement de grille (33) incluant une electrode de grilles (332) and un isolant de griles (331) ; -une tranchee d'isolation (
Proceedings ArticleDOI
Energy-Efficient Bayesian Inference Using Near-Memory Computation with Memristors
Clement Türck,Kamel-Eddine Harabi,Tifenn Hirtzlin,Elisa Vianello,Raphaël Laurent,Jacques Droulez,Pierre Bessière,Marc Bocquet,Jean-Michel Portal,Damien Querlioz +9 more
TL;DR: In this paper , the authors report two fabricated integrated circuits in a hybrid CMOS-memristor process, featuring sixteen tiny memristor arrays and the associated near-memory logic for Bayesian inference.
Proceedings ArticleDOI
A Multimode Hybrid Memristor-CMOS Prototyping Platform Supporting Digital and Analog Projects
Kamel-Eddine Harabi,Clement Türck,Marie Drouhin,Adrien Renaudineau,Thomas Bersani-Veroni,Damien Querlioz,Tifenn Hirtzlin,Elisa Vianello,Marc Bocquet,Jean-Michel Portal +9 more
TL;DR: In this paper, an integrated circuit fabricated in a process co-integrating CMOS and hafnium-oxide memristor technology is presented, which provides a prototyping platform for projects involving memristors.
Proceedings ArticleDOI
An innovative standard cells remapping method for in-circuit critical parameters monitoring
TL;DR: A new way of monitoring critical parameters directly inside circuits, able to transform a circuit into a test vehicle, is introduced: the concept is called topological exchange.
Proceedings ArticleDOI
Effect of multiple injections on the SEEs in SRAM cell
TL;DR: In this article, a new approach to analyze nanometres SRAM response to SEE attributed to proton-silicon interactions is presented, which couples the MUlti SCAles Single-Event Phenomena Predictive Platform (MUSCA SEP3) with SPICE modelling to study multi-injections phenomena.