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Jean-Pierre Faurie

Researcher at Centre national de la recherche scientifique

Publications -  150
Citations -  3800

Jean-Pierre Faurie is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: Molecular beam epitaxy & Superlattice. The author has an hindex of 34, co-authored 150 publications receiving 3741 citations. Previous affiliations of Jean-Pierre Faurie include University of Illinois at Chicago & Saint-Gobain.

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Optoelectronic properties of Cd1−xZnxTe films grown by molecular beam epitaxy on GaAs substrates

TL;DR: In this paper, the compositional dependence of the band gap energy was determined and the free and bound exciton lines for x = 0 and 1 and only broadened bound excititon peaks for other compositions were quantitatively explained based on compositional fluctuations of the cations.
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Direct observation of the core structures of threading dislocations in GaN

TL;DR: In this article, the atomic structure of threading dislocation cores in hexagonal GaN has been directly observed using atomic-resolution Z-contrast imaging, and dislocations with edge character are found to exhibit an eightfold ring core.
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Magneto-optical investigations of a novel superlattice: HgTe-CdTe

TL;DR: In this article, a quasi zero-energy-gap semiconductor superlattice was investigated and the offset between the HgTe and CdTe valence bands was determined in terms of interband transitions from valence to conduction subbands.
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CdTe-HgTe multilayers grown by molecular beam epitaxy

TL;DR: In this article, a multilayer consisting alternately of CdTe and HgTe, repeated 100 times, has been grown at 200'°C with a good crystal quality.
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Defect characterization in ZnO layers grown by plasma-enhanced molecular-beam epitaxy on (0001) sapphire substrates

TL;DR: The structural properties of high-quality (0001)ZnO/Al2O3 films grown by plasmaenhanced molecular-beam epitaxy are investigated by x-ray diffraction and transmission electron microscopy as discussed by the authors.