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Jeff Watson

Researcher at Analog Devices

Publications -  8
Citations -  323

Jeff Watson is an academic researcher from Analog Devices. The author has contributed to research in topics: Analog signal & Data acquisition. The author has an hindex of 3, co-authored 8 publications receiving 234 citations. Previous affiliations of Jeff Watson include Penn State Harrisburg.

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A review of high-temperature electronics technology and applications

TL;DR: In this paper, the authors review the applications that are calling for high temperature electronics, discuss some of the underlying problems with standard technology, and examine the established and emerging technologies that provide solutions to engineers who wish to design high-temperature electronic systems.

High-Temperature Electronics Pose Design and Reliability Challenges

TL;DR: In some applications, cooling may not be possible, or it may be more appealing for the electronics to operate hot to improve system reliability or reduce cost as discussed by the authors, which presents challenges that affect many aspects of the electronic system, including the silicon, packaging, qualification methodology, and design techniques.
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An Ultra-Low Noise Instrumentation Amplifer Designed for High Temperature Applications

TL;DR: In this article, a very low noise instrumentation amplifier designed specifically for high temperature applications is presented, which uses a proprietary silicon-on-insulator process that minimizes parasitic leakage currents at elevated temperature.
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A Low Power Data Acquisition Solution for High Temperature Applications

TL;DR: This work discusses the design of a complete data acquisition circuit building block that will take an analog sensor input, condition it, and digitize it to an SPI serial data stream and will be published and available off the shelf to designers of harsh environment systems.
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High Precision Analog Multiplexers Enable Multi-Channel Data Acquisition in High Temperature Environments

TL;DR: This work discusses two new analog multiplexers rated for 175°C/210°C that allow multiple analog signals to be connected to the ADC input, enabling the design of a precision multi-channel data acquisition system.