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Jeffrey Bokor

Researcher at University of California, Berkeley

Publications -  452
Citations -  24176

Jeffrey Bokor is an academic researcher from University of California, Berkeley. The author has contributed to research in topics: Extreme ultraviolet lithography & Extreme ultraviolet. The author has an hindex of 73, co-authored 440 publications receiving 21890 citations. Previous affiliations of Jeffrey Bokor include University of California & Intel.

Papers
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Journal ArticleDOI

FinFET-a self-aligned double-gate MOSFET scalable to 20 nm

TL;DR: In this paper, a self-aligned double-gate MOSFET, FinFET was proposed by using boron-doped Si/sub 04/Ge/sub 06/ as a gate material.
Journal ArticleDOI

MoS2 transistors with 1-nanometer gate lengths

TL;DR: Molybdenum disulfide (MoS2) transistors with a 1-nm physical gate length using a single-walled carbon nanotube as the gate electrode are demonstrated, which exhibit excellent switching characteristics with near ideal subthreshold swing of ~65 millivolts per decade and an On/Off current ratio of ~106.
Proceedings ArticleDOI

FinFET scaling to 10 nm gate length

TL;DR: In this paper, the authors report the design, fabrication, performance, and integration issues of double-gate FinFETs with the physical gate length being aggressively shrunk down to 10 nm and the fin width down to 12 nm.
Proceedings ArticleDOI

Sub 50-nm FinFET: PMOS

TL;DR: In this article, a self-aligned double-gate MOSFET structure (FinFET) is used to suppress the short channel effect, and a 45 nm gate-length PMOS FinEET is presented.
Patent

Finfet transistor structures having a double gate channel extending vertically from a substrate and methods of manufacture

TL;DR: In this article, a planar MOSFET is fabricated in a silicon layer overlying an insulating layer (e.g., SIMOX) with the device extending from the insulating layers as a fin.