Jeffrey M. Ede

Bio: Jeffrey M. Ede is an academic researcher from University of Warwick. The author has contributed to research in topics: Mean squared error & Artificial neural network. The author has an hindex of 7, co-authored 15 publications receiving 135 citations.

Review: Deep Learning in Electron Microscopy

Abstract: Deep learning is transforming most areas of science and technology, including electron microscopy. This review paper offers a practical perspective aimed at developers with limited familiarity. For context, we review popular applications of deep learning in electron microscopy. Following, we discuss hardware and software needed to get started with deep learning and interface with electron microscopes. We then review neural network components, popular architectures, and their optimization. Finally, we discuss future directions of deep learning in electron microscopy.

Partial Scanning Transmission Electron Microscopy with Deep Learning

Abstract: Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a two-stage multiscale generative adversarial neural network to complete realistic 512 × 512 scanning transmission electron micrographs from spiral, jittered gridlike, and other partial scans. For spiral scans and mean squared error based pre-training, this enables electron beam coverage to be decreased by 17.9× with a 3.8% test set root mean squared intensity error, and by 87.0× with a 6.2% error. Our generator networks are trained on partial scans created from a new dataset of 16227 scanning transmission electron micrographs. High performance is achieved with adaptive learning rate clipping of loss spikes and an auxiliary trainer network. Our source code, new dataset, and pre-trained models are publicly available.

Adaptive learning rate clipping stabilizes learning

Abstract: Artificial neural network training with stochastic gradient descent can be destabilized by "bad batches" with high losses. This is often problematic for training with small batch sizes, high order loss functions or unstably high learning rates. To stabilize learning, we have developed adaptive learning rate clipping (ALRC) to limit backpropagated losses to a number of standard deviations above their running means. ALRC is designed to complement existing learning algorithms: Our algorithm is computationally inexpensive, can be applied to any loss function or batch size, is robust to hyperparameter choices and does not affect backpropagated gradient distributions. Experiments with CIFAR-10 supersampling show that ALCR decreases errors for unstable mean quartic error training while stable mean squared error training is unaffected. We also show that ALRC decreases unstable mean squared errors for partial scanning transmission electron micrograph completion. Our source code is publicly available at this https URL

Deep learning in electron microscopy

Abstract: Deep learning is transforming most areas of science and technology, including electron microscopy. This review paper offers a practical perspective aimed at developers with limited familiarity. For context, we review popular applications of deep learning in electron microscopy. Following, we discuss hardware and software needed to get started with deep learning and interface with electron microscopes. We then review neural network components, popular architectures, and their optimization. Finally, we discuss future directions of deep learning in electron microscopy.

Machine learning with Python

Abstract: This presentation is a case study taken from the travel and holiday industry. Paxport/Multicom, based in UK and Sweden, have recently adopted a recommendation system for holiday accommodation bookings. Machine learning techniques such as Collaborative Filtering have been applied using Python (3.5.1), with Jupyter (4.0.6) as the main framework. Data scale and sparsity present significant challenges in the case study, and so the effectiveness of various techniques are described as well as the performance of Python-based libraries such as Python Data Analysis Library (Pandas), and Scikit-learn (built on NumPy, SciPy and matplotlib). The presentation is suitable for all levels of programmers.

Benefits of depth in neural networks

Abstract: For any positive integer $k$, there exist neural networks with $\Theta(k^3)$ layers, $\Theta(1)$ nodes per layer, and $\Theta(1)$ distinct parameters which can not be approximated by networks with $\mathcal{O}(k)$ layers unless they are exponentially large --- they must possess $\Omega(2^k)$ nodes. This result is proved here for a class of nodes termed "semi-algebraic gates" which includes the common choices of ReLU, maximum, indicator, and piecewise polynomial functions, therefore establishing benefits of depth against not just standard networks with ReLU gates, but also convolutional networks with ReLU and maximization gates, sum-product networks, and boosted decision trees (in this last case with a stronger separation: $\Omega(2^{k^3})$ total tree nodes are required).