J
Jeffrey W. Kysar
Researcher at Columbia University
Publications - 148
Citations - 24473
Jeffrey W. Kysar is an academic researcher from Columbia University. The author has contributed to research in topics: Deformation (engineering) & Electron backscatter diffraction. The author has an hindex of 35, co-authored 139 publications receiving 21356 citations. Previous affiliations of Jeffrey W. Kysar include Columbia University Medical Center & Harvard University.
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Spatially Resolved Characterization of Residual Stress Induced by Micro Scale Laser Shock Peening
TL;DR: In this paper, single crystal aluminum and copper of (001) and (110) orientation were shock peened using laser beam of 12 micron diameter and observed with X-ray micro-diffraction techniques based on a synchrotron light source.
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Structure and Properties of Electrocodeposited Cu-Al2O3 Nanocomposite Thin Films
TL;DR: In this article, a prototype of a microchannel array in the nanocomposite thin film was made using standard microelectromechanical (MEMS) fabrication technology, and the results presented in this paper lay the groundwork for future studies in which the size, volume density, morphology, distribution as well as type of nanoparticle in the nano-composite will be systematically and independently varied in order to optimize mechanical properties.
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3D-Printed Microneedles Create Precise Perforations in Human Round Window Membrane in Situ.
Harry Chiang,Michelle Yu,Aykut Aksit,Wenbin Wang,Sagit Stern-Shavit,Jeffrey W. Kysar,Anil K. Lalwani +6 more
TL;DR: 3D-printed microneedles can create precise perforations in the HRWM without damaging intracochlear structures, and have many potential applications ranging from aspiration of cochlear fluids using a lumenized needle for diagnosis and creating portals for therapeutic delivery into the inner ear.
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Strain gradient crystal plasticity analysis of a single crystal containing a cylindrical void
Ulrik Borg,Jeffrey W. Kysar +1 more
TL;DR: In this article, the effects of void size and hardening in a hexagonal close-packed single crystal containing a cylindrical void loaded by a far-field equibiaxial tensile stress under plane strain conditions are studied.
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The Functional Response of Mesenchymal Stem Cells to Electron-Beam Patterned Elastomeric Surfaces Presenting Micrometer to Nanoscale Heterogeneous Rigidity.
Manus J.P. Biggs,Manus J.P. Biggs,Marc A. Fernandez,Marc A. Fernandez,Dilip Thomas,Ryan Cooper,Matteo Palma,Jinyu Liao,Teresa Fazio,Carl F. O. Dahlberg,Helen Wheadon,Anuradha R. Pallipurath,Abhay Pandit,Abhay Pandit,Jeffrey W. Kysar,Shalom J. Wind +15 more
TL;DR: It is shown for the first time that that direct‐write e‐beam exposure can significantly alter the rigidity of elastomeric poly(dimethylsiloxane) substrates and a new class of 2D elastomersic substrates with controlled patterned rigidity ranging from the micrometer to the nanoscale is described.